Multi-SPAD gating and analog counting circuit applied to TOF technology

Abstract

The invention discloses a multi-SPAD gating and analog counting circuit applied to a TOF technology. The circuit comprises A*B multi-SPAD gating and analog counting sub-circuits, wherein the A and B are both positive integers; and each multi-SPAD gating and analog counting sub-circuit comprises an SPAD unit, a gating unit connected with the SPAD unit, an analog counting unit connected with the gating unit, a reset unit connected with the gating unit and the analog counting unit, and an output unit connected with the analog counting unit. According to the multi-SPAD gating and analog counting circuit disclosed by the invention, a gating technology and an analog counting mode are adopted, so that the chip area is saved, the working efficiency is improved, the interference of background lightnoise is inhibited, and meanwhile, the large-array use requirement can be met.

Description

technical field [0001] The invention belongs to the technical field of photoelectric detection, and in particular relates to a multi-SPAD gated analog counting circuit applied to TOF technology. Background technique [0002] With the development of optical measurement and computer vision, optical three-dimensional measurement technology has gradually matured, and photoelectric information detection and processing technology has also achieved rapid development, especially in the fields of intelligent driving, medical and consumer electronics industries, and has become the current measurement field. hotspot. TOF technology (Time-Of-Flight, time-of-flight) is a more prominent optical measurement technology. Its basic principle is that the sensor emits modulated near-infrared light, which is reflected after encountering an object. The sensor calculates the time difference between emitting and receiving light waves. Or phase difference, which is converted into the distance of th...

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Problems solved by technology

[0004]At present, in order to ensure a certain signal-to-noise ratio, the existing SPAD detectors usually have too many repeated scans, and because of the traditional digital signal readout method, it is necessary to Multiple high-speed counters and latches, etc., the circuit is complex, the chip area is too large, and the integration of the entire circuit is not high, resulting in low work efficiency and being susceptible to interference from background light noise

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