Power device conduction voltage non-stop measurement circuit

Abstract

The invention discloses a power device turn-on voltage non-stop measurement circuit. The circuit comprises a switching device M1, and is characterized in that a drain electrode of the switching deviceM1 is connected with a collector electrode of a tested power device, a grid electrode of the switching device M1 is respectively connected with a positive electrode of the diode D1, one end of the resistor R1 and one end of the capacitor C1, the other end of the capacitor C1 is respectively connected with an emitter of the tested power device, one end of a resistor R0 and one end of a capacitor C2, the other end of the resistor R0 is respectively connected with a source electrode of the switching device M1 and one end of a resistor R2, the other end of the resistor R2 is connected with the other end of the capacitor C2 and serves as an output end of a measuring circuit, and the other end of the resistor R1 is connected with a negative electrode of the diode D1 and receives a grid voltageof the tested power device. The circuit is advantaged in that the circuit is simple in structure, and measurement of a conduction voltage of the power device can be completed without an additional power supply.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a non-stop measurement circuit for the conduction voltage of a power device. Background technique [0002] As the core of power electronic systems, power devices are often the main cause of system failures. According to the industry-wide survey report, the most vulnerable components in power electronic systems are power devices, and about 34% of power electronic system failures are caused by chip or welding failures of power electronic devices. If real-time and effective measures cannot be taken quickly Maintenance measures may cause serious consequences and huge economic losses. Therefore, it is of great significance to study the health status of power devices and improve device reliability technology to improve the overall reliability of power electronic systems. [0003] At present, the health management of power devices is usually realized by monitoring the aging characteristi...

AI Technical Summary

Problems solved by technology

However, in the actual non-stop measurement of the on-state voltage, the test circuit needs to withstand the same voltage drop when the power device is turned off, usually reaching hundreds or even thousands of volts, and it needs to be accurately measured to the millivolt level when the device is turned on. This undoubtedly puts forward higher requirements for the measurement circuit.

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