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Calibration error correction method for full-field spectral calibration of large-aperture static interferometric imaging spectrometer

An imaging spectrometer, static interference technology, applied in interferometric spectroscopy, spectrometry/spectrophotometry/monochromator, instruments, etc., can solve the problem of incomplete calibration coefficient, affecting spectral calibration accuracy, spectral calibration problems such as low efficiency, to achieve the effect of improving accuracy and saving distortion errors

Active Publication Date: 2021-01-15
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] In order to effectively solve the technical problems that the laser field of view cannot cover the entire detector array, resulting in incomplete calibration coefficients affecting the accuracy of spectral calibration, and the low efficiency of spectral calibration for the entire detector array column by column, the present invention provides a Calibration error correction method for full-field spectral calibration of large-aperture static interferometric imaging spectrometer

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  • Calibration error correction method for full-field spectral calibration of large-aperture static interferometric imaging spectrometer
  • Calibration error correction method for full-field spectral calibration of large-aperture static interferometric imaging spectrometer
  • Calibration error correction method for full-field spectral calibration of large-aperture static interferometric imaging spectrometer

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[0029] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0030] Based on the mapping relationship between the interference image and the inversion spectrum of the large-aperture static interference imaging spectrometer, the invention analyzes the offset of the inversion spectrum wavenumber caused by the interference image, establishes a constraint mechanism, and realizes calibration error correction of the full field of view spectrum.

[0031] refer to figure 1 , the concrete steps of the present invention are as follows:

[0032] Step 1): Set the pixel position of the distortion center as 0, obtain the simulated value of the inverted spectrum of the standard laser interference image, and perform different degrees of distortion on it (that is, use different distortion rates to process the simulated value of the inverted spectrum Distortion processing), when the distortion rate k is determined, the...

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Abstract

The invention provides a full-view-field spectral calibration error correction method of a large-aperture static interference imaging spectrometer in order to effectively solve technical problems thatspectral calibration precision is affected by incomplete calibration coefficients due to a fact that a view field of a laser cannot cover a whole detector area array, and spectral calibration efficiency of the whole detector area array column by column is low. Based on an inversion spectrum of the large-aperture static interference imaging spectrometer, a corresponding model between radial distortion of an interference image and a wave number offset of the inversion spectrum is established. In a calibration process, a standard light source cannot cover a whole detector view field range; according to the invention, the spectral calibration coefficient of the whole detector area array can be obtained by using a part of or even only one row of spectral calibration data; and finally, the method serves for spectrum inversion of the large-aperture static interference imaging spectrometer, effectively improves the spectrum calibration precision, and is of great significance to research of adata processing technology of the large-aperture static interference imaging spectrometer.

Description

technical field [0001] The invention relates to a method for correcting calibration errors of full-field spectra, in particular to a method for correcting calibration errors of full-field spectra for large-aperture static interference imaging spectrometers. Background technique [0002] Spectral imaging technology began in the 1980s and is an important branch of remote sensing imaging technology. Imaging spectrometers can simultaneously acquire two-dimensional spatial information and one-dimensional spectral information of a target, which has the characteristics of "integration of image and spectrum", and has important applications in many fields. Among them, Large Aperture Static Imaging Spectrometry (Large Aperture Static Imaging Spectrometry, LASIS) [1] No gaps and moving parts, the advantages of high throughput and high stability coexist. The large-aperture static interferometric imaging spectrometer has the significant advantage of the large-field interferometric imag...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28G01J3/45
CPCG01J3/2823G01J3/45G01J2003/2879
Inventor 王爽安玲坪张耿李娟王一豪陈铁桥武俊强
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI