Sample table for inhibiting quasi-optical cavity degeneration higher-order mode, testing method and application thereof

A sample stage and high-order mode technology, applied in the microwave field, can solve problems such as loss of test accuracy, affecting the sample to be tested, and inability to accurately measure the Q value, and achieve the effect of improving accuracy

Active Publication Date: 2020-04-28
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
  • Description
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Problems solved by technology

In the case of high frequency, there is a non-TEM00p mode that is very close to the frequency of the TEM00p mode, which will lead to the

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  • Sample table for inhibiting quasi-optical cavity degeneration higher-order mode, testing method and application thereof
  • Sample table for inhibiting quasi-optical cavity degeneration higher-order mode, testing method and application thereof
  • Sample table for inhibiting quasi-optical cavity degeneration higher-order mode, testing method and application thereof

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Example Embodiment

[0040] A sample stage for suppressing the degenerate high-order mode of a quasi-optical cavity, comprising a dielectric substrate 4, the center of the dielectric substrate 4 is provided with a circular metal coating 3, and a microwave matching circuit structure is engraved on the metal coating 3 1. The microwave matching circuit structure 1 is a circular metal coating layer 3 symmetrically arranged on both sides of the center of the two gaps parallel to the electric field direction of the TEM00q mode, the dielectric substrate is provided with a circular fixing hole 2 for passing through Fasteners fix the sample stage on the quasi-optical cavity, the thickness of the metal coating 3 is greater than the skin depth of the electromagnetic wave at the operating frequency, and the loss tangent of the dielectric substrate 4 material is higher than 1e-4.

[0041] In this embodiment, the dielectric substrate 4 is an FR-4 rigid dielectric substrate with a thickness greater than 2 mm.

[0042...

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Abstract

The invention provides a sample table for inhibiting a quasi-optical cavity degeneration higher-order mode and a testing method and application thereof. The sample table comprises a dielectric substrate, the center of the dielectric substrate is provided with a circular metal coating layer, and a microwave matching circuit structure is engraved on the metal coating layer. The microwave matching circuit structure comprises two gaps which are symmetrically arranged at two sides of the center of a circle of a circular metal coating layer and are parallel to a TEM00q mode electric field direction.The thickness of the metal coating layer is greater than the skin depth of working frequency point electromagnetic waves; the loss tangent value of the dielectric substrate material is higher than 1e-4. According to the invention, on the premise that the TEM00p mode is not affected, the non-TEM00p mode near the TEM00p mode is not matched, so that the resonance phenomenon cannot be excited; and thus the energy can be consumed through the high-loss substrate, so that double peaks appearing in the TEM00p mode corresponding to the frequency spectrum can be improved into symmetrical single peaks;when the quasi-optical cavity method is used for testing a complex dielectric constant, the test of the Q value corresponding to the TEM00p mode is more real, so that the precision of testing the lossof the material to be tested through the quasi-optical cavity method is improved.

Description

technical field [0001] The invention belongs to the field of microwave technology, in particular to a TEM used in a quasi-optical cavity 00p The sample platform, test method and application of mode measurement complex dielectric constant. Background technique [0002] TEM 00p The quasi-optical cavity of the mode is a microwave resonator, which can be used for broadband complex permittivity measurement of dielectric materials. This technology has the characteristics of fast, broadband, accurate and reliable, and has certain practicability. Its working mode is TEM00p mode, which has the advantages of simple field structure, stability, no dispersion, wide operating frequency and so on. A common quasi-optical cavity test system consists of a reflective surface and a sample stage. There are single or two coupling holes on the reflective surface, which are used for single-port test or dual-port test respectively. By inserting a coupling ring into the coupling hole to align The ...

Claims

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Application Information

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IPC IPC(8): G01R27/26
CPCG01R27/2617G01R27/2641
Inventor 龙嘉威余承勇李恩涂一航李亚峰高冲高勇张云鹏郑虎
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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