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Constant-temperature operation test system and method for semiconductor switching device

A switching device and operation test technology, which is applied in the field of constant temperature operation test system of semiconductor switch devices, can solve the problems of high cost of constant temperature operation test system and poor stability of operation temperature, etc., and achieve the goal of ensuring accuracy, high stability and low cost Effect

Inactive Publication Date: 2020-05-01
青岛聚能创芯微电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a constant temperature operation test system and method for semiconductor switching devices, which are used to solve the problem of high cost and stable operating temperature of the semiconductor switch device in the prior art. gender issues

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  • Constant-temperature operation test system and method for semiconductor switching device

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Embodiment 1

[0038] like figure 1 As shown, the present embodiment provides a constant temperature operation test system 1 of a semiconductor switching device, and the constant temperature operation test system 1 of the semiconductor switch device includes:

[0039] A closed-loop feedback module 11 , a thermocouple 12 , an adjustment module 13 and a control module 14 .

[0040] like figure 1 As shown, the closed-loop feedback module 11 includes a semiconductor switching device Q1, and closed-loop regulation is realized based on the semiconductor switching device Q1.

[0041] Specifically, the closed-loop feedback module 11 includes but is not limited to a switching power supply circuit, and any circuit structure that realizes closed-loop regulation through feedback control of the semiconductor switching device Q1 is applicable to the present invention. The switching power supply circuit includes but not limited to BUCK circuit (step-down conversion circuit), BOOST circuit (boost conversi...

Embodiment 2

[0053] This embodiment provides a constant temperature operation test method of a semiconductor switching device, and the constant temperature operation test method of the semiconductor switch device includes:

[0054] Running the constant temperature operation test system of the semiconductor switching device, monitoring the operating temperature of the semiconductor switching device in real time, comparing the monitored operating temperature with the set temperature to obtain a difference;

[0055] The switching duty cycle of the semiconductor switching device is adjusted based on the difference, so that the operating temperature of the semiconductor switching device is stabilized at a set temperature.

[0056] It should be noted that, in this embodiment, the constant temperature operation test system of the semiconductor switching device is as shown in Embodiment 1. In actual use, any system that can realize the constant temperature operation test method of the semiconductor...

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Abstract

The invention provides a constant-temperature operation test system and method for a semiconductor switching device. The constant-temperature operation test system comprises a closed-loop feedback module, a thermocouple, an adjusting module and a control module, wherein the closed-loop feedback module comprises the semiconductor switching device and realizes closed-loop adjustment based on the semiconductor switching device; the thermocouple is attached to the back surface of the semiconductor switching device and detects the operation temperature of the semiconductor switching device; the adjusting module is connected with the thermocouple, receives a detection signal and a reference signal of the thermocouple and outputs a difference value; and the control module is connected with the adjusting module and the closed-loop feedback module and generates a control signal based on the difference value so as to adjust the switching duty ratio of the semiconductor switching device and enable the operation temperature of the semiconductor switching device to be kept at a set temperature. The constant-temperature operation test system is used for detecting whether the semiconductor switching device can reliably operate at a certain limit temperature for a long time on an application system, conditions such as a load or an input voltage of the system do not need to be manually adjusted, the operation time of the semiconductor switching device in each switching period is automatically adjusted, the system is simple, the cost is low, and the stability is high.

Description

technical field [0001] The invention relates to the field of semiconductor switching devices, in particular to a constant temperature operation test system and method for semiconductor switching devices. Background technique [0002] A semiconductor switching device is a semiconductor device that can respond quickly to switching actions, and is widely used in various integrated circuit designs. Semiconductor switching devices need to handle high voltage and high current, and frequently perform switching actions during the working process, so failures are prone to occur; and the reliability of a semiconductor switching device directly affects whether the entire circuit module can work normally, so for semiconductor switches Device reliability testing is particularly important. [0003] Temperature will have a certain impact on semiconductor materials (including but not limited to the impact of positive temperature coefficient and negative temperature coefficient), so we need...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327
CPCG01R31/327
Inventor 李全春袁理李成
Owner 青岛聚能创芯微电子有限公司