Windowing type GTEM cell suitable for electromagnetic compatibility test of integrated circuit

Abstract

The invention discloses a windowing type GTEM cell suitable for an electromagnetic compatibility test of an integrated circuit. The windowing type GTEM cell comprises a bottom bracket, the top of thebottom bracket is fixedly connected with a bottom cover plate; side plates are fixedly connected to the front end and the rear end of the top of the bottom cover plate; a top cover plate is fixedly connected to the top between the two side plates, a rear cover plate is fixedly connected to the rear ends of the two side plates, a shielding door is fixedly installed at the position, close to the left side, of the side plate at the front end of the top of the bottom cover plate through hinges, and a limiting core plate is placed at the position, close to the middle, of the top cover plate. According to the windowing type GTEM cell suitable for the electromagnetic compatibility test of the integrated circuit, the test frequency can be expanded to 18GHz, the test result repeatability is good, the result can be reproduced, the GTEM transverse electric wave transmission chamber adopts a coaxial and asymmetric rectangular transmission line design principle, and in order to avoid reflection ofinternal electromagnetic waves and generate a high-order mode and resonance, the overall design is wedge-shaped.

Description

technical field [0001] The invention relates to the technical field of electromagnetic testing, in particular to a windowed GTEM cell suitable for electromagnetic compatibility testing of integrated circuits. Background technique [0002] Existing methods usually use the TEM chamber method for the EMC test of integrated circuits, and the test frequency can only be tested to 3GHz due to technological limitations; [0003] The existing TEM cell test method is to put the test product inside the test chamber, so the power supply, placement and test position of small test products such as integrated circuits cannot be effectively determined; [0004] Existing test methods do not clearly specify the test methods for the EMC test methods of integrated circuits, nor do they have special test equipment and environments. Therefore, we propose a windowed GTEM cell suitable for IC EMC testing. Contents of the invention [0005] The object of the present invention is to provide a win...

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Problems solved by technology

[0005] The object of the present invention is to provide a windowed GTEM cell suitable for integrated circuit electromagnetic compatibility testing, to solve the problem that the electromagnetic compatibility testing of integrated circuits proposed in the above background technology cannot be effectively determined due to process limitations, test positions, etc. Clearly stipulated test methods and problems with no special test equipment and environment

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