Cold and hot impact device

Abstract

The invention discloses a cold and hot impact device. The cold and hot impact device comprises a base; a control box which is fixed on the base, wherein a controller is arranged in the control box; anexcitation assembly which is fixed to the upper portion of the side face of the control box, and further comprises an exciter used for being connected with an optical fiber probe for testing photoelectric properties and an exciter fixing base, wherein the exciter is fixedly installed on the exciter fixing base, a chip is arranged in the exciter, and a power module is arranged in the exciter fixing base; a cold and hot impact box which comprises a box body and a box cover, wherein a semiconductor refrigeration chip, a sample groove and a metal block are arranged in the box body, the upper surface of the trough block is provided with the sample groove filled with a sample to be detected, and the metal block is arranged at the lower part of the trough block; one part of the semiconductor refrigeration chip is embedded in the lower part of the trough block, the other part of the semiconductor refrigeration chip is embedded in the upper part of the metal block, and the semiconductor refrigeration chip is electrically connected with the controller. When the cold and hot impact device is in a test state, the sample tank is arranged below the exciter. According to the device, the temperature variation and testing functions are integrated on the same device.

Description

technical field [0001] The invention belongs to the field of optical characteristic testing equipment for LED fluorescent materials at different temperatures, and in particular relates to a cold and heat shock equipment. Background technique [0002] The luminous performance of LED devices is not only related to its electrical properties, but also affected by its temperature. The slow heat dissipation of existing LEDs leads to temperature rises and shortens the life of LEDs. Therefore, it is particularly important to study the optical properties of LED devices at different temperatures. However, the current thermal shock equipment can only heat or cool LED devices to different temperatures, and testing the optical characteristics requires special instruments. Therefore, it is particularly important to develop a thermal shock equipment that integrates temperature and testing. Contents of the invention [0003] The present invention aims at the above-mentioned problems in t...

AI Technical Summary

Problems solved by technology

However, the current thermal shock equipment can only heat the LED device to different temperatures or cool it down, and testing the optical characteri

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