Solar cell panel defect detection system based on machine vision and detection method

A solar panel and flaw detection technology, which is applied in the direction of optical testing flaws/defects, instruments, measuring devices, etc., can solve the problems of low detection efficiency and low detection rate of solar panels, and achieve fast image processing speed and detection The effect of high efficiency and high detection efficiency

Pending Publication Date: 2020-06-05
TAIYUAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
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Problems solved by technology

[0003] The invention proposes a machine vision-based solar panel defect detection system and detection method, which solves the problems of low detection efficiency and low detection rate of solar panels in the prior art

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  • Solar cell panel defect detection system based on machine vision and detection method
  • Solar cell panel defect detection system based on machine vision and detection method
  • Solar cell panel defect detection system based on machine vision and detection method

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[0037] The following description and drawings fully illustrate the specific embodiments herein to enable those skilled in the art to practice them. Parts and features of some embodiments may be included in or substituted for parts and features of other embodiments. The scope of the embodiments herein includes the entire scope of the claims, and all available equivalents of the claims. Herein, the terms "first", "second", etc. are only used to distinguish one element from another element, and do not require or imply any actual relationship or order between these elements. Actually the first element can also be called the second element and vice versa.

[0038] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the e...

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Abstract

The invention provides a solar cell panel defect detection system based on machine vision. The solar cell panel defect detection system comprises a vision camera, a vision analysis module, a PLC and aremoving device, wherein the vision camera is used for acquiring images of the surfaces of solar cell panels and transmitting the acquired images to the vision analysis module; the vision analysis module processes and analyzes the images transmitted by the vision camera and transmits a detection result to the PLC; and the PLC is connected with a sensor at the same time, the sensor counts the found solar cell panels with flaws and transmits a trigger signal to the PLC, and the PLC controls the removing device to remove the solar cell panels with the flaws. According to the solar cell panel defect detection system, an advanced algorithm and image processing software of the intelligent camera are adopted to more accurately detect the flaws which cannot be observed by the naked eyes, the image processing speed is high, the detection efficiency is high, compared with manual detection, the detection efficiency is improved by 90%, the detection rate of the tiny flaws is improved by 80%, andmanual detection is perfectly replaced.

Description

Technical field [0001] The present invention relates to the technical field of machine vision recognition, in particular to a solar cell panel defect detection system based on machine vision, and also to a solar cell panel defect detection method based on machine vision. Background technique [0002] At present, the production quality of solar panels in the field of solar panel production has attracted much attention from manufacturers. The damage of solar panels is the main reason that directly leads to the quality of solar panels, and it is difficult to detect small defects. There are few defects on the surface of the solar cell panel in the current solar cell inspection, mainly manual observation inspection and infrared image inspection. However, the above two detection methods have their limitations: manual observation requires a lot of labor and the accuracy rate is not high. The current production process has some defects that are difficult to observe with the naked eye. Wi...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/342B07C5/02B07C5/36G01N21/95G01N21/88
CPCB07C5/3422B07C5/02B07C5/361B07C5/362G01N21/95G01N21/8851G01N2021/8887
Inventor 薛彬茌文清丁震矫爽本孟庆森周凤敏翟明戈
Owner TAIYUAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
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