Multi-path intermittent disconnection fault parallel test system based on FPGA

A technology for disconnecting faults and testing systems, which is applied in the direction of electronic circuit testing, measuring electronics, and measuring devices. It can solve problems such as low efficiency, lack of detection methods, and high rate of missed detection in testing, so as to save testing resources and improve testing difficulties. The effect of avoiding missed detection of intermittent faults

Active Publication Date: 2020-06-09
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

[0015] The purpose of this application is to provide a new FPGA-based parallel test system for multi-channel intermittent disconnection faults in view of the lack of multi-channel intermittent disconnection fault detection means, high test missed detection rate and low efficiency in complex electronic equipment. It makes it possible to cover the intermittent faults of many connection links in electronic equipment with a small intermittent fault test module path, realize the synchronous parallel testing of multiple intermittent disconnection faults, and avoid missed detection at the same time

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  • Multi-path intermittent disconnection fault parallel test system based on FPGA
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  • Multi-path intermittent disconnection fault parallel test system based on FPGA

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[0033] In order to more clearly understand the above purpose, features and advantages of the present application, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0034] In the following description, a lot of specific details are set forth in order to fully understand the application, however, the application can also be implemented in other ways different from those described here, therefore, the protection scope of the application is not limited by the following disclosure Limitations of specific embodiments.

[0035] like figure 1As shown, this embodiment provides an FPGA-based multi-channel intermittent disconnection fault parallel test system, which is suitable for detecting and diagnosing intermittent disconnection fau...

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Abstract

The invention discloses a multi-path intermittent disconnection fault parallel test system based on an FPGA, and is suitable for intermittent disconnection fault detection and diagnosis of a pluralityof connection links in electronic equipment. The system includes: a voltage coupling module which is arranged at the detection end of the system, wherein the voltage coupling module comprises a plurality of coupling sub-modules, any coupling sub-module comprises a first resistor and a second resistor which are connected in parallel, one end of the first resistor and the second resistor are connected in parallel and then connected to the detection end, the other end of the first resistor is connected to the low level end of the system, the other end of the second resistor is connected to the output end of the coupling sub-module, and the coupling sub-module is used for transmitting a voltage signal of the second resistor to a signal processing module; and the signal processing module whichis used for judging that an intermittent disconnection fault occurs in the connection link when judging that the voltage signal is smaller than the fault voltage threshold. With application of the technical scheme, parallel detection of the intermittent faults of the multiple connection links is achieved, and the problems that the intermittent faults are difficult to test and incomplete in test coverage are solved.

Description

technical field [0001] The present application relates to the technical field of fault detection, in particular to an FPGA-based multi-channel intermittent disconnection fault parallel testing system. Background technique [0002] Intermittent disconnection fault is the long-term effect of long-term vibration, temperature and other environmental stress and load stress on the equipment, which reaches a certain degraded state. During service, it is subjected to real-time strong vibration, heat radiation and other high stress to produce a sudden change effect, which occurs randomly from time to time. A connection-type failure of very short duration. Its essence is the effect of the coupling between the damage state of the connection link and the real-time stress under the long-term action of multiple stresses. [0003] In electronic equipment, the connection link is usually used as an important signal transmission channel, and the reasons for its intermittent disconnection fai...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2812
Inventor 刘冠军李华康吕克洪邱静张勇杨鹏吴晓龙程先哲祝尊卿
Owner NAT UNIV OF DEFENSE TECH
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