Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Double-layer symmetrical differential plane eddy current detection sensor

A symmetrical differential and eddy current detection technology, which is applied in the direction of instruments, measuring devices, scientific instruments, etc., to achieve the effect of increasing lift-off height and sensitivity, improving defect detection rate, and reducing electromagnetic interference

Active Publication Date: 2020-07-10
UNIV OF ELECTRONICS SCI & TECH OF CHINA +1
View PDF10 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to overcome the deficiencies of the prior art, to provide a double-layer symmetrical differential planar eddy current detection sensor, which can be detected in a higher lift-off range through the improved excitation coil and detection coil, and the differential coupling benefit is reduced. Lift-off noise, which makes up for the shortcomings of existing eddy current sensors that are affected by lift-off and cause a sharp drop in sensitivity

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-layer symmetrical differential plane eddy current detection sensor
  • Double-layer symmetrical differential plane eddy current detection sensor
  • Double-layer symmetrical differential plane eddy current detection sensor

Examples

Experimental program
Comparison scheme
Effect test

example

[0035] In order to better illustrate the technical effects of the present invention, specific experiments are used to verify the optimal coupling distance, and different thicknesses of insulating covering layers are used for experimental comparison. Figure 5 It is the actual image of the planar eddy current detection sensor with double-layer symmetrical difference in this embodiment. Such as Figure 5 As shown, the parameters of each component of the multi-layer electromagnetic shielding pulse far-field eddy current detection sensor in this embodiment are as follows:

[0036] The excitation coil 7 is made of PCB immersion gold technology, placed on the upper layer of the sensor, and the total length of a single coil is l 1 =24mm, width is w 1 =30mm, wire diameter is d 11 =10mil, line spacing is d 12 =10mil, the number of turns is n 1 =20, the distance between the exciting coils is r 1 = 2.5mm, the thickness of the copper layer is 2 oz, and the thickness of the excitatio...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
lengthaaaaaaaaaa
distanceaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a double-layer symmetrical differential plane eddy current detection sensor. An excitation signal is generated by a signal generator and sent to a power amplifier; after beingamplified by the power amplifier, the signal is connected to a bonding pad of the exciting coil through a lead; the exciting coil generates a primary magnetic field under the driving of an exciting signal; when the tested piece is in the primary magnetic field, the primary magnetic field generates eddy current on the surface of the tested piece; the flow direction of the eddy current at the defectpart is changed; because the vortex changes, a secondary magnetic field generated by the eddy current is changed; the magnetic flux which passes a detecting coil changes; the amplitude and the phaseof the coil are further detected to be changed; therefore, the induced voltage generated by the primary magnetic field and the induced voltage generated by the secondary magnetic field are input intothe signal processing circuit through the bonding pad of the detection coil, then amplitude and phase extraction is carried out, the collected detection signals are processed through the upper computer after amplification and filtering processing, and then defect information is accurately detected.

Description

technical field [0001] The invention belongs to the technical field of eddy current nondestructive testing, and more specifically relates to a double-layer symmetrical differential planar eddy current testing sensor. Background technique [0002] Non-destructive testing refers to the detection method that uses physical methods to evaluate the integrity of the measured object without damaging the measured object, and is an important guarantee for the safety and reliability of the system. It is widely used in industry, aerospace, nuclear industry, such as rail, oil and gas pipelines, nuclear industry, aerospace and other material defect detection. Eddy current testing is one of the common non-destructive testing methods. Its characteristics of non-contact, no coupling agent, low cost and easy automatic detection have attracted the attention of scholars at home and abroad. Eddy current testing is to pass an alternating current on the excitation coil, and use the changing magn...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/90
CPCG01N27/9046G01N27/9006Y02E30/30
Inventor 高斌陈科帆姜世强田贵云张勇
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com