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Sensitive detection method for defects of solar cell

A solar cell and sensitive detection technology, applied in the field of solar cell defect detection, can solve the problem of difficulty in detecting tiny defects in solar cells, and achieve the effect of low test cost

Pending Publication Date: 2020-08-04
SPIC XIAN SOLAR POWER CO LTD +3
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Problems solved by technology

[0003] However, the electroluminescence (EL) method is currently used as the mainstream in battery manufacturing workshops, which can only detect obvious defects such as hidden cracks, black chips, and broken grids inside solar cells, and it is difficult to detect tiny defects inside solar cells.

Method used

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  • Sensitive detection method for defects of solar cell
  • Sensitive detection method for defects of solar cell

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Embodiment

[0036] according to Figure 1 to Figure 5 As shown, the sensitive detection method for solar cell defects provided by the present invention includes the following steps:

[0037] 1) Test the dark I-V characteristics of the solar cell to determine whether the solar cell is normal;

[0038] 2) If the battery is normal, test the noise power spectral density (Sv-f) curve under 0.7V forward bias;

[0039] 3) If the voltage noise power spectral density curve presents a crest shape, it is a GR noise characteristic;

[0040] 4) Test the Sv-f curve at different temperatures to extract the GR noise peak value (Sv) and its corresponding frequency value (f);

[0041] 5) According to the extracted Sv-f value, draw an Arrhenius curve, thereby obtaining defect information.

[0042] The step 1) includes:

[0043] (1) Place the solar cell in a sealed box to simulate a non-light condition;

[0044] (2) Apply a forward voltage to the solar cell to obtain the battery forward current-voltage characteristic cu...

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Abstract

The invention aims at disclosing a sensitive detection method for defects of a solar cell. Compared with the prior art, the method can detect tiny defects, especially the deep energy level defects, inthe battery accurately, nondestructively and sensitively through variable-voltage noise test and a variable-temperature noise test; and the method is suitable for all solar cells with grid line structures, only the grid line connection mode when positive and negative electrodes are led out needs to be changed, a special detection table board is not needed, the test cost is much lower than EL, andthe purpose of the method is achieved.

Description

Technical field [0001] The invention relates to a detection method of solar cell defects, in particular to a sensitive detection method of solar cell defects. Background technique [0002] As an important form of clean new energy, photovoltaic power generation technology is mainly used outdoors. As the core component of solar cells, the electrical and physical properties of solar cells are bound to appear various declines due to the shelter of dust on the modules and the penetration of rainwater. Therefore, strict testing methods are required before module packaging to ensure the stable and reliable performance of solar cells. [0003] However, the electroluminescence (EL) method is currently the mainstream in battery manufacturing workshops, which can only detect significant defects such as cracks, black chips, and broken grids inside solar cells, and it is difficult to detect small defects inside solar cells. [0004] Therefore, a sensitive detection method for solar cell defects ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66H01L31/18
CPCH01L31/18H01L22/12Y02P70/50
Inventor 胡林娜倪玉凤张婷
Owner SPIC XIAN SOLAR POWER CO LTD
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