Power cycling test apparatus and system for semiconductor devices

A technology of power cycle and test device, applied in the field of power cycle test device and system, can solve the problems that the control of junction temperature and case temperature does not meet the experimental requirements, the test device is easy to age, and the cost is high, and achieves long service life and high reliability. , the effect of reducing costs

Active Publication Date: 2022-07-01
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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Problems solved by technology

[0005] In view of this, the embodiment of the present invention provides a power cycle test device and system for semiconductor devices to solve the problems that the control of junction temperature and case temperature in traditional power cycle tests does not meet the experimental requirements, and the test device is prone to aging and high cost.

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  • Power cycling test apparatus and system for semiconductor devices
  • Power cycling test apparatus and system for semiconductor devices
  • Power cycling test apparatus and system for semiconductor devices

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Embodiment Construction

[0048] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0049] see figure 1 , a power cycle test device for a semiconductor device provided by an embodiment of the present invention is used for the reliability test of power electronic devices, and mainly supports the power cycle test of SMD (Surface Mounted Devices, surface mount) packaged high-power power electronic devices, It is suitable for semiconductor devices with high current and high power above 200A, such as power diodes, MOS tubes, IGBTs, etc.

[0050] The device mainly includes: a base 100, an electrode device 200, a device positioning frame 300, an ela...

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Abstract

The invention belongs to the field of semiconductor testing, and provides a power cycle test device and system for semiconductor devices. The system includes an industrial computer, a power-on device, a thermal tester and a test device. equipment and temperature detection equipment; the power-on equipment cyclically powers up the electrode equipment within a preset number of cycles; the thermal tester obtains the voltage of the device under test, and determines the voltage corresponding to the voltage of the device under test according to the pre-calibrated voltage junction temperature curve. Junction temperature; the industrial computer controls the power-on device to cycle power on the electrode within a preset number of cycles, and also obtains the case temperature and junction temperature of the device under test, if any of the case temperature, junction temperature and junction temperature variation are not satisfied When the temperature condition is preset, the power-on equipment is controlled to stop working, so as to ensure the smooth progress of the power cycle test and high reliability. At the same time, the invention uses the mechanical structure to fasten, avoids problems such as damage, connection falling off, aging, etc., can withstand large current, and has a long service life. long.

Description

technical field [0001] The invention belongs to the field of semiconductor testing, and more particularly relates to a power cycle testing device and system for semiconductor devices. Background technique [0002] Power electronic devices are concentrated in the three major product areas of motor drive, charging and discharging, and power conversion. With the development of the third-generation semiconductor technology and the new energy vehicle industry, power electronic devices have also ushered in new development opportunities, and market demand has grown rapidly. , only for new energy vehicles, the annual domestic demand for automotive-grade IGBT modules is several million, and power electronic devices are gradually becoming a hot spot in the semiconductor industry. [0003] The rapid development of related industries provides a broad market demand for reliability testing of power electronic devices. Life test is currently the most commonly used and effective reliabilit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 迟雷桂明洋高蕾黄杰彭浩高金环陈龙坡张瑞霞
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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