Method and system for measuring focus drift distance of microscopic image and computer equipment

Abstract

The invention discloses a method for measuring the focus drift distance of a microscopic image. The method comprises the following steps: acquiring a microscopic image sequence; calculating a radial average logarithm power spectrum value of each incoherent focus stack image, and obtaining a focusing position of a microscope objective lens according to the radial average logarithm power spectrum value; marking each coherent focus stack image according to the focusing position; dividing the marked coherent focus stack image into a training set and a verification set; training a pre-constructed convolutional neural network model by using the training set, and verifying the trained convolutional neural network model by using the verification set to obtain a trained convolutional neural networkmodel; and measuring the focus drift distance of the microscopic image to be measured by using the trained convolutional neural network model. According to the method provided by the invention, the focus drift distance can be measured only through a single image, the speed is high, the precision is high, and the robustness of the convolutional neural network model is high.

Description

Technical field [0001] The invention relates to the field of microscopic imaging technology, in particular to a method and system for measuring the focus drift distance of a microscopic image, and computer equipment. Background technique [0002] For high-throughput applications of various digital microscopes, maintaining the focus of microscopic images for a long period of time is a critical task. Many biological experiments involve the use of a microscope to perform long-term or large-scale microscopic imaging of the sample, which makes it difficult to focus the sample continuously. [0003] For large-scale microscopic imaging applications, when scanning and stitching multiple microscope fields to form high-content, high-resolution microscopic images, due to changes in sample shape or uneven surface of the stage, it is necessary to adjust each The field of view is refocused to obtain a clear full-field image. [0004] For long-term microscopic imaging applications, when observing...

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Problems solved by technology

[0006] The invention provides a method, system and computer equipment for measuring the focus drift distance of a microscopic image, which are used to overcome defects such as relatively large errors in the prior art

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