Switch matrix channel fault diagnosis method and system

Abstract

The invention discloses a switch matrix channel fault diagnosis method and system. The method comprises the steps: constructing a test channel matrix for a channel where a switch to be tested is located in a switch matrix; performing reflection signal test on the detection nodes in the test channel matrix, judging whether the detection nodes are in a reflection state or not through a preset reflection signal threshold, and constructing a test channel detection node matrix; comparing the test channel detection node matrix with a normal channel detection node matrix to obtain a fault point channel; and based on frequency domain reflection, positioning the position of a reflected signal, namely the position of the fault point, for the detection node of the fault point channel. Rapid detectionand fault diagnosis positioning of multiple channels are realized, and the uncertainty problem of false alarm generated by an indirect equivalent method is solved according to effective detection ofthe real physical connection state of the channels constructed by the switch matrix.

Description

Technical field [0001] The invention relates to the technical field of microwave testing, in particular to a switch matrix channel fault diagnosis method and system. Background technique [0002] The statements in this section merely provide background information related to the present invention, and do not necessarily constitute prior art. [0003] With the rapid development of microwave semiconductor devices (integrated circuits) and their technologies, the integrated functions and technical characteristics of microwave semiconductor devices (integrated circuits) have been continuously improved. There are more and more test parameters that characterize their corresponding functions and technical characteristics. It is also getting bigger and bigger. Correspondingly, the application of switch matrix products to meet this demand in microwave semiconductor device testing has become more and more extensive. [0004] Using traditional methods, the internal switch status detection and ...

AI Technical Summary

Problems solved by technology

However, even if the test results show that there is a fault in the channel, it is impossible to accurately diagnose and locate the fault location of the channel, and it is necessary to perform manual judgment and positioning through repeated disassembly, commissioning and testing.

In practical applications, the test scale of microwave semiconductor devices (integrated circuits) is usually large, and the channel scale and complexity of the corresponding switch matrix to meet the requirements are relatively high.

[0007] In summary, the inventor believes that the traditional method not only lacks the technical means to effectively detect the real state, but also the commissioning operation process is complicated and inefficient, and it is difficult to effectively meet the maintenance guarantee of switch matrix (type) products and microwave semiconductor devices ( Integrated circuit) related application requirements and technical requirements for multi-parameter and high-efficiency testing

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