Dual ion source slow electron velocity imaging device

A speed imaging, ion source technology, applied in the direction of ion source/gun, measuring device, circuit, etc., can solve the problem of time-consuming, limited research system scope and flexibility, and complicated experimental operation.

Active Publication Date: 2020-10-02
SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
View PDF14 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, there are very few research groups at home and abroad using time-of-flight mass spectrometry combined with slow electron velocity imaging technology to study anion clusters. Most of their instruments use a single ion source, which severely limits the scope and flexi

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Dual ion source slow electron velocity imaging device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0022] The purpose of the present invention is to provide a dual ion source slow electron velocity imaging device to solve the problems existing in the prior art, so that the instrument has the integration of dual ion sources, and has the ability to detect single charges and multiple charges generated by solid phase and liquid phase samples. Ability to cluster anions.

[0023] In order to make the above objects, features and advantages of the present invention...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Hole diameteraaaaaaaaaa
Cone angleaaaaaaaaaa
Diameteraaaaaaaaaa
Login to view more

Abstract

The invention discloses a dual ion source slow electron velocity imaging device. The device comprises a laser evaporation ion source, an electrospray ion source, an analysis chamber, a time-of-flightmass spectrometry system and a slow electron velocity imaging system, wherein the laser evaporation ion source and the electrospray ion source are respectively arranged on two sides of the analysis chamber, the time-of-flight mass spectrometry system and the slow electron velocity imaging system are both arranged in the analysis chamber, and a matched camera is arranged outside the analysis chamber. The design of the double ion sources widens the research system of a single device and the generation channel of the target anion cluster; the device has the capability of detecting single-charge and multi-charge anion clusters generated by solid-phase and liquid-phase samples, and compared with two instruments with single ion sources, the integration of the double ion sources has the advantages that accessories such as a vacuum cavity, a molecular pump and a detector are saved, the expenditure is saved, and meanwhile, the operation steps of the instrument are simplified.

Description

technical field [0001] The invention relates to the technical field of mass spectrometry and photoelectron imaging, in particular to a dual ion source slow electron velocity imaging device. Background technique [0002] Gas phase experiments can avoid the influence of complex chemical environments, sample defects, inhomogeneity and other factors in liquid and solid phases, and provide an ideal research model for isolated systems. Single- and multiply-charged anion clusters are widely distributed in nature, and exploring their geometric and electronic structures is of great significance for understanding chemical reactions in nature and designing industrial catalysts. The laser evaporation cluster source can ionize solid-phase metals, metal compounds and other samples to generate single-charged anion clusters. The electrospray ion source can ionize the organic matter in the liquid phase to generate multi-charged anion clusters of small organic molecules and biological macrom...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01J49/16H01J49/40H01J49/10G01N27/62
CPCH01J49/161H01J49/165H01J49/40H01J49/107G01N27/62Y02A90/10
Inventor 王永天刘洪涛费泽杰韩昌财董常武洪静
Owner SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products