Dual ion source slow electron velocity imaging device
A speed imaging, ion source technology, applied in the direction of ion source/gun, measuring device, circuit, etc., can solve the problem of time-consuming, limited research system scope and flexibility, and complicated experimental operation.
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[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0022] The purpose of the present invention is to provide a dual ion source slow electron velocity imaging device to solve the problems existing in the prior art, so that the instrument has the integration of dual ion sources, and has the ability to detect single charges and multiple charges generated by solid phase and liquid phase samples. Ability to cluster anions.
[0023] In order to make the above objects, features and advantages of the present invention...
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