Chip constant-temperature and high-temperature testing and sorting all-in-one machine
An all-in-one, high-temperature technology, which is applied in the field of high-temperature testing and sorting all-in-one chips, and can solve problems such as low work efficiency
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[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0033] See Figure 1-5 , An integrated chip testing and sorting machine at normal high temperature, comprising a feed turret module 1, a high temperature turret module 2, a discharge turret module 3, an equipment alarm system 4, and an equipment electrical box mechanism 5.
[0034] Such as figure 1 with figure 2 As shown, a feeding turret module 1 is fixedly connected to the left side of the upper surface of the electrical box mechanism 5...
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