Chip constant-temperature and high-temperature testing and sorting all-in-one machine

Abstract

The invention relates to the technical field of semiconductor processing, and discloses a chip constant-temperature and high-temperature testing and sorting all-in-one machine. The chip constant-temperature and high-temperature testing and sorting all-in-one machine comprises a feeding turret module, a high-temperature turret module, a discharging turret module, an equipment alarm system and an equipment power box mechanism, wherein the feeding turret module is fixedly connected with the left side of the upper surface of the equipment power box mechanism, the high-temperature turret module isarranged on the right side of the upper surface of the equipment power box mechanism, the discharging turret module is arranged at the upper end of the equipment power box mechanism, and the equipmentalarm system is fixedly connected with the upper end of the high-temperature turret module. According to the chip constant-temperature and high-temperature testing and sorting all-in-one machine, a plurality of independent normal-temperature and high-temperature testing and sorting equipment is completely integrated on one device, so that automobile electronic components can be sufficiently heated in a high-temperature tunnel, the electric performance testing in the high-temperature environment state is realized, the site space is saved, the product carrying time is shortened, and therefore the working efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor processing, in particular to an integrated machine for testing and sorting chips at normal high temperature. Background technique [0002] Because automotive electronic products require electronic components not only to have good performance and reliability, but also to be able to perform various performance tests under normal temperature and high temperature (30°C ~ 150°C) environmental conditions. Usually, it is relatively easy to test the performance of semiconductor electronic components in a normal temperature environment. Due to the limitations of mechanical design, material structure, process technology, and high temperature control errors at high temperatures, it is difficult to integrate semiconductor electronic components on one device. High temperature test. Usually, independent normal temperature test equipment and high temperature test equipment are used to form a process flow ...

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Problems solved by technology

[0005] Aiming at the deficiencies of the prior art, the present invention provides a normal-temperature testing and sorting integrated machine for chips, which has the advantages of improving work efficiency, etc., and solves the need for independent normal-temperature testing equipment and high-temperature testing in the traditional process mentioned in the above-mentioned background technology. Equipment and other components of the process flow, the problem of low work efficiency in the overall operation

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