The invention relates to the technical field of semiconductor processing, and discloses a chip constant-temperature and high-temperature testing and sorting all-in-one machine. The chip constant-temperature and high-temperature testing and sorting all-in-one machine comprises a feeding turret module, a high-temperature turret module, a discharging turret module, an equipment alarm system and an equipment power box mechanism, wherein the feeding turret module is fixedly connected with the left side of the upper surface of the equipment power box mechanism, the high-temperature turret module isarranged on the right side of the upper surface of the equipment power box mechanism, the discharging turret module is arranged at the upper end of the equipment power box mechanism, and the equipmentalarm system is fixedly connected with the upper end of the high-temperature turret module. According to the chip constant-temperature and high-temperature testing and sorting all-in-one machine, a plurality of independent normal-temperature and high-temperature testing and sorting equipment is completely integrated on one device, so that automobile electronic components can be sufficiently heated in a high-temperature tunnel, the electric performance testing in the high-temperature environment state is realized, the site space is saved, the product carrying time is shortened, and therefore the working efficiency is improved.