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New generation CIR automatic test fixture and implementation method thereof

An automatic test, a new generation of technology, used in manufacturing tools, workpiece holding devices, transmission systems, etc., can solve the problems of many test items, infrequently used, no need to meet fast field tests, etc., to improve the test speed, meet the The effect of consistency

Pending Publication Date: 2020-10-27
TIANJIN 712 COMM & BROADCASTING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, most of the existing functional tests of train integrated wireless communication equipment adopt manual testing methods. Due to the disadvantages of long testing time and poor consistency of test results, this method cannot meet the needs of rapid on-site testing.
Manual testing requires on-site personnel to be proficient in multiple testing methods, and there are many testing items, some of which are not commonly used. These problems add difficulty and a lot of uncertainty to the testing work

Method used

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  • New generation CIR automatic test fixture and implementation method thereof
  • New generation CIR automatic test fixture and implementation method thereof

Examples

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Embodiment Construction

[0010] In order to understand the present invention more clearly, the following detailed description is given in conjunction with the accompanying drawings and embodiments.

[0011] Such as figure 1 with figure 2 As shown, a CIR3.0 automatic test fixture includes a switching power supply chip model LM22670, a low-dropout linear voltage regulator chip model LP5907MFX-1.8, a CAN isolation transceiver chip model CTM1051KAT, and an Ethernet switch chip model IP175C. Chip, CODEC chip model TLV320AIC3106, processor chip model LPC4337JBD144, Flash memory chip model MX66L51235F.

[0012] The input end of the switching power supply chip is connected to the external DC12V power supply, and the output end is connected to the input end of the low-dropout linear voltage regulator chip and the DC3.3V power supply input of the CAN isolation transceiver chip, Ethernet switching chip, CODEC chip, processor chip, and Flash memory chip. end; the output end of the low-dropout linear voltage re...

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PUM

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Abstract

The invention discloses a new generation CIR automatic test fixture and an implementation method thereof. The test fixture comprises a switch power supply chip, a low voltage difference linear voltagestabilizing chip, a CAN isolation transceiver chip, an Ethernet switching chip, a CODEC chip, a processor chip and a storage chip. The implementation method comprises the following steps of completing the test calibration work on train comprehensive wireless communication equipment by the test fixture and a designated test instrument; controlling the train comprehensive wireless communication equipment to enter a test item through a CAN bus, interacting digital audio data, controlling the test instrument to enter the test item through an Ethernet, returning test result data, and sending demodulated audio to the test instrument through a coaxial audio interface and receiving audio to be modulated sent by the test instrument; and meanwhile, connecting the test instrument with a transceivinginterface of the train comprehensive wireless communication equipment through a radio frequency coaxial line. According to the new generation CIR automatic test fixture and the implementation methodthereof, the test of the train comprehensive wireless communication equipment is completed on the site without professional testers, so that the test is accelerated, and the consistency of a calibration result is improved.

Description

technical field [0001] The invention relates to a test fixture for wireless communication equipment, in particular to a new generation of CIR automatic test fixture suitable for train integrated wireless communication equipment and a realization method thereof. Background technique [0002] At present, most of the existing functional tests of train integrated wireless communication equipment adopt manual testing methods. Due to the shortcomings of long testing time and poor consistency of test results, this method cannot meet the needs of rapid on-site testing. Manual testing requires on-site personnel to be proficient in multiple testing methods, and there are many testing items, some of which are not commonly used. These problems add difficulty and a lot of uncertainty to the testing work. Contents of the invention [0003] In view of the problems existing in the existing manual testing, in order to meet the testing needs of non-professionals on site, realize efficient a...

Claims

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Application Information

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IPC IPC(8): B25B11/00G06F13/42H04B17/00H04L12/40
CPCB25B11/00G06F13/42H04B17/00H04L12/40H04L2012/40215
Inventor 李臻冯卓赵堃
Owner TIANJIN 712 COMM & BROADCASTING CO LTD
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