Resonant cavity type two-dimensional material photothermal effect measuring device

A technology of two-dimensional materials and photothermal effects, which is applied in the directions of measuring devices, analyzing materials, and material analysis through optical means, etc., can solve the problems of complex devices for the photothermal effects of two-dimensional materials, and achieve simple optical paths, high detection sensitivity, and experimental Simple operation effect

Inactive Publication Date: 2020-12-01
西安柯莱特信息科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the laboratory, the device for measuring the photothermal effect of two-dimensional materials is complex

Method used

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  • Resonant cavity type two-dimensional material photothermal effect measuring device
  • Resonant cavity type two-dimensional material photothermal effect measuring device
  • Resonant cavity type two-dimensional material photothermal effect measuring device

Examples

Experimental program
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Effect test

Embodiment 1

[0021] The present invention provides a resonant cavity-type two-dimensional material photothermal effect measurement device, including: a light source, a photodetector, a substrate, and a first rectangular noble metal part 1 placed on the substrate, a second rectangular noble metal part 2, a resonant cavity 3, Sensitive Materials Section 4. Two-dimensional materials. like figure 1 As shown, the first rectangular noble metal part 1 and the second rectangular noble metal part 2 are parallel and form a metal-dielectric-metal waveguide, and the metal-dielectric-metal waveguide includes a waveguide input end and a waveguide output end. The material of the first rectangular noble metal part 1 and the second rectangular noble metal part 2 is noble metal. Preferably, the material of the first rectangular noble metal part 1 and the second rectangular noble metal part 2 is gold. The width of the metal-dielectric-metal waveguide is less than 100 nanometers. A light source generates l...

Embodiment 2

[0025] On the basis of Example 1, such as figure 2 As shown, the sensitive material part 4 is circular, and the size of the sensitive material part 4 is the same as that of the resonant cavity 3 . That is to say, the sensitive material portion 4 fills the resonant cavity 3 . At this time, the two-dimensional material is circular, and the two-dimensional material is not in contact with the second rectangular noble metal part 2 . During preparation, the resonant cavity 3 can be filled with sensitive materials, and the preparation is simple.

Embodiment 3

[0027] On the basis of Example 2, such as image 3 As shown, the sensitive material part 4 is circular, and the center of the sensitive material part 4 coincides with the center of the resonant cavity 3 . 2D materials are circular. The two-dimensional material is in contact with the ring-shaped sensitive material portion 4 . In this way, the amount of sensitive material in the sensitive material portion 4 is small. When the two-dimensional material generates heat, the temperature of the sensitive material part 4 is higher, the refractive index of the sensitive material part 4 is changed more, and the resonant wavelength of the resonant cavity 3 is changed more, thereby improving the sensitivity of the photothermal effect detection of the two-dimensional material.

[0028] Furthermore, the sensitive material portion 4 is in contact with the resonant cavity 3 . In the resonant cavity 3, the electric field is mainly distributed inside the resonant cavity 3, that is, the place ...

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Abstract

The invention relates to the field of two-dimensional material photothermal characteristic detection, and particularly provides a resonant cavity type two-dimensional material photothermal effect measuring device. During measurement, the two-dimensional material is arranged on a sensitive material part, the two-dimensional material absorbs the energy of incident light to generate heat, the sensitive material part absorbs heat to increase the temperature, the refractive index of the sensitive material part is changed, the resonant wavelength of the resonant cavity is changed, and the photothermal characteristic of the two-dimensional material is determined according to the relationship between the intensity of the incident light and the resonant wavelength. Since the resonance wavelength ofthe resonant cavity is very sensitive to the refractive index of the material in the resonant cavity, the device has the advantage of high detection sensitivity of the photothermal effect of the two-dimensional material. The light path is based on the metal-medium-metal waveguide, and the light path is simple. In addition, when the photothermal effect of the two-dimensional material is tested, only the two-dimensional material to be tested needs to be arranged on the sensitive material part, and the experimental operation is simple.

Description

technical field [0001] The invention relates to the field of photothermal characteristic detection of two-dimensional materials, in particular to a resonant cavity type two-dimensional material photothermal effect measurement device. Background technique [0002] The photothermal effect refers to the phenomenon that a material generates heat when it is irradiated by light. Two-dimensional materials such as graphene, transition metal sulfides, and black phosphorus have unique optoelectronic properties and have attracted extensive attention. The photothermal effect of these materials makes them have good application prospects in biological imaging and biological detection. Therefore, it is very important to measure the photothermal effect of these materials. There is currently no mature commercial measurement equipment. In the laboratory, the device for measuring the photothermal effect of two-dimensional materials is complicated. Contents of the invention [0003] In or...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17
CPCG01N21/171
Inventor 不公告发明人
Owner 西安柯莱特信息科技有限公司
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