An Ultrafast Imaging Device Based on Spectrum-Time Mapping
A technology of time-mapping and imaging devices, applied in measuring devices, optical radiometry, spectrometry/spectrophotometry/monochromators, etc., to achieve simple and easy-to-build effects
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[0038]This embodiment is observed for the ultra-fast dynamic process of femtosecond laser ablation silicon. Since femtosecond laser and material interaction, the extensive focus of scientists is caused by the application of scientists. Ultra-fast lasers can change the status and properties of the material, which can be used for high quality, high precision, and complex three-dimensional structures of almost any material. The process of femtosecond laser and material interaction, including electron excitation, electron-lattice heat conduction, material eruption, and removal, belongs to the ultra-fast process, time from femtosecond to nanoseconds. In order to understand and control these super fast dynamic processes, it is necessary to rely on ultra-fast observation technology. Here, the ultra-fast dynamic process of observing femtosecond laser ablation silicon in the present invention is taken as an example.
[0039]Seefigure 1 ,figure 2 This embodiment is completed by the present inven...
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