A test method, device and system for MCU low power consumption mode switching
A technology of low power consumption mode and test method, which is applied in the field of MCU test, can solve the problems such as the inability to carry out automatic integrated test, and achieve the effect of high test effect and high test accuracy
Active Publication Date: 2022-03-25
中电海康无锡科技有限公司
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[0005] The present invention provides a test method for MCU low-power mode switching, a test device for MCU low-power mode switch and a test system for low-power mode switch, which solves the problems in related technologies that cannot be automatically integrated test question
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[0044] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0045] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only Embodiments of some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0046] It should be noted that the terms "f...
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The present invention relates to the technical field of MCU testing, and specifically discloses a test method for MCU low-power mode switching, which includes: sending a control signal for entering a low-power mode test mode to the MCU to be tested according to a test command of a host computer; obtaining The first state detection signal of the MCU to be tested in the low power consumption mode; send a wake-up signal to the MCU to be tested, and the wake-up signal is used to make the MCU to be tested exit the low power consumption mode; obtain the information for exiting the low power consumption mode The second state detection signal of the MCU to be tested; judge whether the low power consumption mode switching of the MCU to be tested is normal according to the comparison of the first state detection signal and the second state detection signal, and obtain a judgment result; The results are sent to the host computer for display. The invention also discloses a test device and system for MCU low power consumption mode switching. The test method for MCU low power consumption mode switching provided by the invention can realize automatic integration for testing.
Description
technical field [0001] The invention relates to the technical field of MCU testing, in particular to a test method for MCU low-power mode switching, a test device for MCU low-power mode switching, and a test system for low-power mode switching. Background technique [0002] In the current MCU (microcontroller) application scenarios, many need low power consumption considerations, that is, the lower the power consumption of the MCU chip and its solutions in the working, standby or sleeping states, the better. The design of the MCU will combine different application scenarios to design low-power modes with different power consumption levels, which can be mainly divided into normal working mode, sleep mode, stop mode and shutdown mode. In practical applications, the low power consumption of the MCU can be achieved by stopping the running program, switching the low-frequency system clock, turning off some peripheral modules, or turning off the clock. At present, the normal work...
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IPC IPC(8): G05B23/02
CPCG05B23/0256G05B2219/24065
Inventor 徐琴钱斌常夕阳王瀚正
Owner 中电海康无锡科技有限公司