Equipment capable of carrying out index test on photoelectric products and semiconductor elements
A technology for index testing and optoelectronic products, which is applied in the direction of single semiconductor device testing, non-contact testing, and components of electrical measuring instruments, etc. Natural environment, resource reduction, cost reduction effects
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[0033] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0034] see Figure 1-8 , the embodiment of the present invention provides a technical solution: a device for index testing of optoelectronic products and semiconductor components, including a base plate 1 and a detection box 2, the middle part of the top of the base plate 1 is fixedly connected with the bottom of the detection box 2, and the detection box 2 One side of the front surface is fixedly connected with a hinge 3, and the surface of the detection box ...
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