Embedded tuning circuit board probe for testing radio frequency signals based on radio frequency-free test socket

Abstract

The invention relates to an embedded tuning circuit board probe for testing a radio frequency signal based on a radio frequency-free test socket. The embedded tuning circuit board probe is applied toa test system of the radio frequency-free test socket. The probe comprises a tuning assembly, the tuning assembly is electrically connected with a signal pin, the signal pin is connected with an antenna matching circuit of a mainboard to be tested, the tuning assembly is further provided with a connection port, and the connection port is used for connecting a radio frequency test cable and a control line of the tuning assembly and is connected with an external test instrument through the radio frequency test cable, a control line of the tuning assembly is used for receiving a control signal, so that impedance matching is performed between the tuning assembly and the antenna matching circuit, the purpose of omitting a radio frequency test seat is achieved; the tuning assembly is embedded inthe radio frequency test needle, and the signal needle and the connection port are connected to the tuning assembly, so that the resistance and interference caused by the radio frequency test probe and the radio frequency line are reduced, the operation complexity of impedance matching of the whole path is reduced, the adjustment time and the verification time are saved, and the effectiveness ofthe detection effect is ensured, the structural size is reduced, and the application is convenient.

Description

technical field [0001] The invention relates to the technical field of radio frequency signal testing, in particular to an embedded tuning circuit board probe for testing radio frequency signals based on a non-radio frequency test socket. Background technique [0002] In recent years, with the continuous development of communication technology, the popularity of wireless products has become higher and higher, and the number of wireless products produced in the world is also increasing every year, and people's production and life are becoming more and more convenient. Wireless products (represented by mobile phones) mainly refer to the communication frequency of 300kHz ~ 300GHz, and the communication signals in this frequency range are also called radio frequency signals. In order to ensure the quality of the RF signal on the motherboard of wireless products and meet a series of the most basic wireless communication requirements of wireless products, it is usually necessary t...

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Problems solved by technology

[0004] On the basis of saving the design of the radio frequency test seat, the inventor found that the test can be carried out by direct mechanical contact with the antenna shrapnel, during which a certain impedance matching adjustment is required to meet the preconditions of the test, so as to have a good test effect, because The traditional board-level test path of the mainboard of wireless products is constructed by using RF test sockets, RF probes and RF cables with an impedance of 50 ohms. The impedance of the entire path is continuous. When the shrapnel is in mechanical contact with the radio frequency test of the main board of the wireless product, the test path impedance of the antenna matching circuit component between the RF chip and the antenna shrapnel is not continuous at 50 ohms. It will correspond to the unused antenna matching circuit, so after the RF test probe, it is necessary to set impedance matching for tuning to make the entire board-level path testable. However, it is found in the research that the setting position of the module with tuning function in the circuit is also It will affect the effect of impedance matching. If the tuning module is added after the RF test probe, the effect of impedance matching will be weakened due to the 50 ohm impedance transmission line of the RF test probe itself; so in the above technical background Next, it is also necessary to solve the problem of how to set the relative position relationship between the RF test probe and the tuning module circuit board, so as to ensure that the impedance matching effect will not be affected under the test without the RF test socket

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