45results about How to "Test normal" patented technology

The invention discloses a testing processing method which comprises the steps of: encapsulating a data-driven and data determination connectivity fault management test data into a data-driven and data determination connectivity fault management test message according to appointed speed control; and transmitting the well encapsulated data-driven and data determination connectivity fault management test message to an appointed data-driven and data determination connectivity fault management test point. In addition, the invention also discloses corresponding test processing equipment and a test system. The invention can control the flux of processing the messages by the equipment in the data-driven and data determination connectivity fault management test at each participant node so as to control the test message flux to be limited in the processing capacity range of the equipment at each node.

The invention discloses blood glucose meter test paper. The blood glucose meter test paper comprises a test paper main board (4), wherein a front surface circuit (2) and a rear surface circuit (5) are printed on the front surface and the back surface of the test paper main board (4) respectively; the test paper main board (4) is provided with two small holes; the small holes are used for communicating the front surface circuit (2) and the rear surface circuit (5), which are printed on the test paper main board, into glucose oxidase (3) in a testing region, wherein the glucose oxidase (3) is printed on the test paper main board (4); and furthermore, a front surface panel (1) and a rear surface panel (2) are further arranged and are stuck on two sides respectively, and the shapes of the two panels are the same.

The invention discloses a semiconductor structure, a forming method thereof and a test method. The semiconductor structure comprises a front-end chip, a metal layer located on the back surface of the front-end chip and a protection layer located on the metal layer, wherein the protection layer can protect the metal layer from being polluted. Thereby, the protection layer is used to protect the metal layer on the semiconductor structure from being oxidized by air, moisture and other substances, and generation of white spot defects is avoided. In the case of test, the protection layer can be removed, the test can be carried out normally, and the product yield can be improved.

The invention relates to the technical field of measuring of ground stress, in particular to a sectional combined type water pressure cracking stress measuring filter. The sectional combined type water pressure cracking stress measuring filter comprises a hollow pipe column, a first filter and a second filter, wherein the first filter and the second filter are respectively of a hollow column body structure; the second filter is sheathed at the outer side of the first filter; one end of the first filter is connected with one end of the hollow pipe column. The sectional combined type water pressure cracking stress measuring filter has the advantages that after simple assembly, the graded filtering can be performed, so that the iron rust is prevented from entering a push-pull switch, and the testing can be smoothly performed; the blockage of filter holes by chemical grease is avoided, the liquid is guaranteed to normally enter the push-pull switch, and the testing can be smoothly performed.

The invention relates to the technical field of memory testing, in particular to a memory testing method and device and electronic device.The method comprises the steps that a fault physical address and a preset address offset of a target memory are obtained; determining a fault physical address range based on the fault physical address and the preset address offset; setting attributes of all physical addresses in the fault physical address range to be locked; converting the fault physical address range into a virtual address range; and performing memory testing on the target memory based on the virtual address range. The test objects in the target memory are screened by using the fault physical address, the test is performed only for the fault physical address range without integral test, the memory test range is reduced, and the memory fault coupling and multiple write-in fault representation enable the memory fault to occur in the adjacent row and column range, so that the test efficiency is improved. Therefore, the reliability of the test result can be ensured by testing the fault physical address range.

The invention discloses a train dormancy wake-up control method, comprising: issuing a dormancy command to the train, the train sends a dormancy request to a trackside area controller after receiving the dormancy command; the trackside area controller judges whether the dormancy preparation is completed, If it is ready, the train dormancy request is rejected. If the dormancy preparation is completed, the trackside area controller will send a dormancy confirmation. If the train receives the dormancy confirmation within the first preset time limit, it will interact with the train failure monitoring execution preset number of dormancy request confirmations; Complete the preset number of dormancy request confirmation interactions within the second preset time limit, then the train will save the state data before the on-board dormancy within the third preset time limit, otherwise stop dormancy; The device disconnects the communication, outputs a power-off command, and the train only keeps the wake-up device and the train-ground communication device live and working, and reports that the sleep is successful. The invention also discloses a train dormancy wake-up control system. The invention is based on the communication train automatic control system and can realize the automatic detection and automatic execution of sleep wake-up.

The invention discloses blood glucose meter test paper. The blood glucose meter test paper comprises a test paper main board (4), wherein a front surface circuit (2) and a rear surface circuit (5) are printed on the front surface and the back surface of the test paper main board (4) respectively; the test paper main board (4) is provided with two small holes; the small holes are used for communicating the front surface circuit (2) and the rear surface circuit (5), which are printed on the test paper main board, into glucose oxidase (3) in a testing region, wherein the glucose oxidase (3) is printed on the test paper main board (4); and furthermore, a front surface panel (1) and a rear surface panel (2) are further arranged and are stuck on two sides respectively, and the shapes of the two panels are the same.

The invention discloses a product testing production line. The product testing production line comprises a frame, a control device, a conveying assembly line, a testing station, a tray and a manipulator, wherein the conveying assembly line and the testing station are arranged on the frame respectively; the conveying assembly line and the testing station are arranged in parallel; the tray is arranged on the testing station; the manipulator is arranged on the conveying assembly line; the conveying assembly line, the testing station and the manipulator are electrically connected with the control device respectively; and the tray is electrically connected with the testing station. The technical scheme has the beneficial effects that automatic carrying and testing are realized, product loss caused by manually carrying is avoided, appropriate carrying is ensured, normal testing is ensured, labor force is effectively is saved, and the production cost is lowered.

The invention discloses a test method for detecting the compressive bearing capacity of a grouting body at the end of a recoverable anchor rod, comprising the following steps: S1. Install the tensionable and recoverable anchor rod top bars on the surface of the grouting body at the top of the recoverable anchor rod S2, start the jack to stretch the bar body, and use the load sensor and displacement meter to collect the tensile displacement and tensile load of the bar body respectively, and draw the tensile load-tensile displacement curve; S3, pass the tensile load - The tensile displacement curve determines the failure node where the grouting body under the bearing plate is damaged, and terminates the test loading after failure; the tensile load of the failure node is the ultimate load of the grouting body at the end of the recoverable anchor rod, and the ultimate load is divided by The compressive safety factor of the grouting body is the compressive bearing capacity of the grouting body; by placing the jack against the surface tensioning bar of the grouting body at the top of the recyclable bolt, the grouting body can achieve self-balance and avoid the grouting body being pulled out and damaged. , to ensure that the grouting body at the pressure-bearing plate is destroyed first, so as to achieve the purpose of testing the compressive bearing capacity of the grouting body on site.

The sealing device and installation method of the ship stern shaft temperature sensor, the sealing device is a Pulica tube connector, the sealing locking ring and the anti-locking connector are sequentially set on the Pulica tube, and the Pulica tube passes through the Pulica tube. The card tube connector is installed in the sensor connector, and the anti-lock connector is threadedly connected with the tail of the sensor connector. After tightening, the plika tube connector and the sealing locking ring are locked. Mounting holes on the threaded connection. The installation method of the sealing device mainly includes: passing the sensor wire through the installation hole; filling an appropriate amount of sealant at the connection in the sensor connector, and then putting the Pulica tube connector and the sealing locking ring into the sensor connector; Pass the plika tube through the anti-lock connector, seal the locking ring, assemble the plika tube with the plika tube connector; wear the sensor wire, the front part of the sensor connector is threaded with the mounting hole, and the tail Threaded with anti-lock connector. The advantages are good sealing performance and safe and reliable operation of the stern shaft.

The invention discloses an AMOLED (active-matrix organic light emitting diode) display device, which comprises a substrate and a display panel layer, wherein matrix frame strips are arranged on the substrate; a plurality of sub-pixel intervals are spaced between the matrix frame strips; a colored light resistance strip covers each sub-pixel interval; the matrix frame strips are matched with the colored light resistance strip, so that the display panel layer is defined; a horizontal protective layer covers the colored light resistance strip; a polaroid covers the horizontal protective layer; the edges of four sides of the polaroid are bonded with and fixed to the edges of four sides of the horizontal protective layer by virtue of glass powder; heat-conductive sheets are arranged at the lower sides of the edges of the four sides of the horizontal protective layer; and a plurality of heat-conductive sheets, which get into contact with the matrix frame strips, are arranged on the lower end faces of the heat-conductive sheets. The display device provided by the invention is reasonable in structural layout, effective in heat conduction and heat dissipation, low in production and manufacturing difficulties and stable and reliable in connecting structure.

The invention discloses a disk spring hanger with three guide posts and a limiting function, comprising a bottom plate, wherein the bottom plate is connected with the lower ends of the guide posts, a pressing plate is sleeved on the upper parts of the guide posts, the upper end parts of the guide posts above the pressing plate are in threaded connection with guide post nuts, a center hole is arranged in the central position of the pressing plate, a disk spring is arranged between the pressing plate and the bottom plate; the guide posts are in threaded connection with a limiting nut below the pressing plate, the pressing plate and the bottom plate are disk-shaped, the three guide posts are distributed uniformly along the circumferential direction. The invention has the advantages of capable of position limit in pre-operational test, material saving, low cost, and the like.

The invention discloses a business test method and system. The method comprises the following steps: obtaining a script file related to business operation according to a test case; adding a response assertion to the script file, executing the script file, verifying whether error information exists in the execution process through the response assertion, if the error information exists, adjusting service parameters in the script file until the error information does not exist, and obtaining a test script file matched with the test case; and testing the service operation by using the test script file to obtain a test result. In order to solve the problem that corresponding business operation cannot be successfully executed when an unprocessed script file is executed, the script file is pre-executed, the execution process is verified by responding to assertion, and it is ensured that a test script file which cannot report errors and can normally run is obtained.

The present invention relates to the technical field of circuit board detection, in particular to a high-precision circuit board detection device, which includes a test bench, support plates respectively arranged on both sides of the top of the test bench, a board loading module, and a test device. The test device includes a machine Cover, test installation frame, probe test integrated board, lifting mechanism, the test installation frame is connected with the machine cover through the lifting mechanism, and the rear ends of both sides of the machine cover are respectively hinged with the rear ends of the supporting plates on the corresponding side; the lifting mechanism Including the lifting frame and the lifting cylinder, the two sides of the lifting frame are symmetrically provided with guide holes, the two sides of the machine cover are respectively provided with vertical strip holes along the Z-axis direction, and the two sides of the test mounting frame are respectively provided with rollers. The roller passes through the guide hole and rolls into the vertical strip hole; the invention can realize the contact connection between the probe test integrated board and the circuit board to be tested stably and with high precision, can ensure the normal progress of the circuit board test, and can Improve the overall test efficiency of the circuit board.

The invention is an embedded tuning circuit board probe for testing radio frequency signals based on a non-radio frequency test socket, which is applied to a test system without a radio frequency test socket; it includes a tuning component, and the tuning component is electrically connected with a signal pin, a signal pin and an antenna of the main board to be tested The matching circuit is connected, the tuning component is also provided with a connection port, the connection port is used to connect the radio frequency test cable and the control line of the tuning component, and is connected with the external test instrument through the radio frequency test cable, and the control line of the tuning component is used to receive the control signal, so that the tuning The component and the antenna matching circuit are impedance matched; the purpose of eliminating the RF test socket is achieved; the tuning component is embedded in the RF test pin, and the signal pin and the connection port are connected to the tuning component, reducing the RF test probe and RF line The resulting impedance interference reduces the operational complexity of the impedance matching of the entire channel, saves adjustment time and verification time, and ensures the effectiveness of the detection effect; it also reduces the structural volume and is convenient for application.

The invention discloses a test method for inter-frequency cell update, which performs an inter-frequency cell update test on user equipment supporting E-DCH by reconfiguring signaling wireless bearer to RACH / FACH. By using the method of the invention, the test of the E-DCH channel can be normally completed in the update test of the inter-frequency cell without any modification to the network system.

The invention discloses a device and method for electrochemical hydrogen permeation measurement in a high-temperature environment and belongs to the field of electrochemical hydrogen permeation measurement technologies. The device comprises a cathode chamber, an anode chamber, an external circulating constant-temperature oil bath device, a constant current meter, an electrochemical workstation anda data collection device, wherein an electrolytic solution is contained in the cathode chamber and the anode chamber, organic alcohol with a melting point lower than 80 DEG C and a boiling point greater than 150 DEG C is used as a matrix of the electrolytic solution, phosphoric acid and phosphate are dissolved in the matrix, and the organic alcohol can dissolve the phosphoric acid and the phosphate in an 80-150 DEG C working environment. The test method comprises the steps that a sample is fixed into a double-electrolytic cell, the electrolytic solution is added into the cathode chamber and the anode chamber, and the external circulating constant-temperature oil bath device is utilized to maintain an electrochemical hydrogen permeation test in the cathode chamber and the anode chamber inthe 80-150 DEG C high-temperature environment. Through the device and method, the problem that electrochemical hydrogen permeation is unavailable under the temperature of 80 DEG C or above is solved,the temperature range of the electrochemical hydrogen permeation test is expanded, and important scientific research value is obtained.

The invention discloses a multi-channel nA-level micro-current transmission design method, which is characterized in that it includes the following steps: shielding protection and seamless connection design steps to ensure that the micro-current signal is not interfered by the outside, and the step includes the entire micro-current loop for complete Shielding, selecting double-shielded cables as connecting cables, selecting double-shielded connectors and selecting wired relays; PCB board design steps to ensure the independence of loop signals and not be affected by switching signals. This step includes placing the entire circuit on the printed board. The micro-current test path is suspended to ensure the isolation of leakage current interference; c is a layered design step to separate the high-voltage circuit from the micro-current detection circuit. The invention not only ensures the normal transmission of micro-current, but also successfully solves the problem of testing the insulation resistance of 1TΩ aerospace-grade capacitors at the highest voltage of 1000Vdc, and can be widely used in testing the insulation resistance of civilian-grade, military-grade, and aerospace-grade capacitors. Measurement.