Inline tuned circuit board probes for testing RF signals based on RF-free test sockets

Abstract

The invention is an embedded tuning circuit board probe for testing radio frequency signals based on a non-radio frequency test socket, which is applied to a test system without a radio frequency test socket; it includes a tuning component, and the tuning component is electrically connected with a signal pin, a signal pin and an antenna of the main board to be tested The matching circuit is connected, the tuning component is also provided with a connection port, the connection port is used to connect the radio frequency test cable and the control line of the tuning component, and is connected with the external test instrument through the radio frequency test cable, and the control line of the tuning component is used to receive the control signal, so that the tuning The component and the antenna matching circuit are impedance matched; the purpose of eliminating the RF test socket is achieved; the tuning component is embedded in the RF test pin, and the signal pin and the connection port are connected to the tuning component, reducing the RF test probe and RF line The resulting impedance interference reduces the operational complexity of the impedance matching of the entire channel, saves adjustment time and verification time, and ensures the effectiveness of the detection effect; it also reduces the structural volume and is convenient for application.

Description

technical field [0001] The invention relates to the technical field of radio frequency signal testing, in particular to an embedded tuning circuit board probe for testing radio frequency signals based on a non-radio frequency test socket. Background technique [0002] In recent years, with the continuous development of communication technology, the popularity of wireless products has become higher and higher, and the number of wireless products produced in the world is also increasing every year, and people's production and life are becoming more and more convenient. Wireless products (represented by mobile phones) mainly refer to the communication frequency of 300kHz ~ 300GHz, and the communication signals in this frequency range are also called radio frequency signals. In order to ensure the quality of the RF signal on the motherboard of wireless products and meet a series of the most basic wireless communication requirements of wireless products, it is usually necessary t...

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Problems solved by technology

[0004] On the basis of saving the design of the radio frequency test seat, the inventor found that the test can be carried out by direct mechanical contact with the antenna shrapnel, during which a certain impedance matching adjustment is required to meet the preconditions of the test, so as to have a good test effect, because The traditional board-level test path of the mainboard of wireless products is constructed by using RF test sockets, RF probes and RF cables with an impedance of 50 ohms. The impedance of the entire path is continuous. When the shrapnel is in mechanical contact with the radio frequency test of the main board of the wireless product, the test path impedance of the antenna matching circuit component between the RF chip and the antenna shrapnel is not continuous at 50 ohms. It will correspond to the unused antenna matching circuit, so after the RF test probe, it is necessary to set impedance matching for tuning to make the entire board-level path testable. However, it is found in the research that the setting position of the module with tuning function in the circuit is also It will affect the effect of impedance matching. If the tuning module is added after the RF test probe, the effect of impedance matching will be weakened due to the 50 ohm impedance transmission line of the RF test probe itself; so in the above technical background Next, it is also necessary to solve the problem of how to set the relative position relationship between the RF test probe and the tuning module circuit board, so as to ensure that the impedance matching effect will not be affected under the test without the RF test socket

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