Spread spectrum clock signal testing device and method based on ATE testing machine

Abstract

The invention belongs to the field of electronic testing, and particularly relates to a spread spectrum clock signal testing device and method based on an ATE testing machine. In the scheme of the invention, an ATE testing machine is connected with a tested chip and a spread spectrum clock testing circuit board through a bus interface; a tested chip needs to provide two paths of clocks for the spread spectrum clock testing circuit board, the ATE testing machine transmits a working parameter range to the spread spectrum clock testing circuit board, and the spread spectrum clock testing circuitboard completes measurement of spread spectrum clock signal working parameters, compares the spread spectrum clock signal working parameters with the working parameter range provided by the ATE testing machine and returns a comparison result to the ATE testing machine. The spread spectrum clock testing function of the ATE testing machine is realized through the externally-expanded spread spectrumclock testing circuit board, the spread spectrum clocks of various digital devices can be sampled and analyzed, the hardware cost is low, the testing response speed is high, expensive desk type testing instruments and equipment can be replaced to a certain extent, and the practicability is very high.

Description

technical field [0001] The invention belongs to the field of electronic testing, and in particular relates to a spread spectrum clock signal testing device and method based on an ATE testing machine. Background technique [0002] Spread spectrum clocks are widely used in engineering projects with electromagnetic compatibility design requirements, such as PCIE 3.0 bus, DDR3 storage and other fields. The schematic diagram of the spread spectrum clock is as follows figure 1 shown. By performing frequency modulation on the clock signal within a certain frequency range, the signal power is dispersed within a certain frequency domain bandwidth range, and the peak power of the clock signal in the frequency domain is reduced. [0003] At present, mainstream test instrument manufacturers have test solutions for spread spectrum clocks. For example, Tektronix's DPO7000 series high-performance oscilloscope integrates DPOJET test software, which can test the modulation period and freq...

AI Technical Summary

Problems solved by technology

Because the timing of the spread spectrum clock is difficult to accurately predict, and the digital I / O sampling rate of the ATE test machine is limited, the modulation cycle and frequency range of the spread spectrum clock signal cannot be tested

Images