Device and method for simultaneously measuring topological charge and positive and negative of vortex beam

A vortex beam and topological charge technology, which is applied in measuring devices, photometry, optical radiation measurement, etc., can solve the problem that the detection device is not compact enough, the dimensional accuracy and collimation requirements are high, and it is difficult to obtain the topological charge at the same time and symbolic information

Active Publication Date: 2021-02-05
SHANDONG NORMAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the interferometry refers to interfering the vortex beam to be measured with a beam of reference light, and then obtaining the topological charge information from the interference pattern. The reference beam can be a plane wave or a spherical wave. The typical interference optical path structure is based on the Mach-Zehnder double beam. Interferometry, but the two-beam interferometry requires an ideal reference beam, which makes the detection device not compact enough, and the optical path is complex and very sensitive to environmental disturbances
The diffraction method refers to analyzing the far-field or focused

Method used

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  • Device and method for simultaneously measuring topological charge and positive and negative of vortex beam
  • Device and method for simultaneously measuring topological charge and positive and negative of vortex beam
  • Device and method for simultaneously measuring topological charge and positive and negative of vortex beam

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Embodiment 1

[0031] In order to realize the simultaneous measurement of the size and sign of the topological charge of the vortex beam, in this embodiment, a device for simultaneously measuring the size and sign of the topological charge of the vortex beam is disclosed. The principle is as follows figure 1 shown, including:

[0032] The angular gradient attenuation sheet is used for angular modulation of the electric field amplitude of the vortex beam to be measured;

[0033] A focusing lens is used to focus the modulated vortex beam;

[0034] The CCD camera is used to record the focused light intensity, and obtain the size and positive and negative information of the topological charge of the vortex beam to be measured through the focused light intensity distribution.

[0035] Further, the front focal plane of the focusing lens is the incident surface of the vortex beam modulated by the angular gradient attenuation sheet.

[0036] Further, the angular gradient attenuation film is locate...

Embodiment 2

[0053] In this embodiment, a method for simultaneously measuring the size and sign of the topological charge of a vortex beam is disclosed, including:

[0054] The vortex beam to be measured is subjected to angular modulation of the electric field amplitude through the angular gradient attenuation sheet;

[0055] Focus the modulated vortex beam through the focusing lens;

[0056] The focused light intensity of the focused beam is recorded by a CCD camera;

[0057] The size and positive and negative information of the topological charge of the vortex beam to be measured are obtained by focusing the light intensity distribution.

[0058] Further, the number of singular points of the focused light intensity is the size of the topological charge of the beam to be measured, and the splitting direction of the singular point reflects the positive or negative of the topological charge of the vortex beam to be measured.

[0059] Furthermore, the light intensity of the spot containing...

Embodiment 3

[0068] An electronic device is disclosed in this embodiment, including a memory, a processor, and computer instructions stored in the memory and executed on the processor. When the computer instructions are executed by the processor, the method disclosed in Embodiment 2 is completed. step.

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Abstract

The invention discloses a device and method for simultaneously measuring the topological charge size and positive and negative values of a vortex light beam. The device comprises an angular gradual-change attenuation piece which is used for the angular modulation of the amplitude of an electric field of a to-be-measured vortex light beam; a focusing lens which is used for focusing the modulated vortex light beam; and a CCD camera that is used for recording the focusing light intensity and obtaining the size and positive and negative information of the topological charge of the vortex beam to be measured through the distribution of the focusing light intensity. By means of the technical scheme, simultaneous measurement of the topological charge and the positive and negative values of the vortex beam to be measured is realized.

Description

technical field [0001] The present disclosure relates to a device and a method for simultaneously measuring the size and the positive and negative of the topological charge of a vortex beam. Background technique [0002] The statements in this section merely provide background information related to the present disclosure and do not necessarily constitute prior art. [0003] A vortex beam is a beam with a spiral phase structure, and its spiral phase structure can be expressed by the phase factor exp(-ilθ), where θ represents the azimuth angle of the vortex beam in the cylindrical coordinate system, and l is called The topological charge indicates the number of phase reversals within a wavelength range. When the phase is reversed counterclockwise, the topological charge is positive, otherwise it is negative. At the same time, each photon in the vortex beam carries The orbital angular momentum of is the reduced Planck constant. At present, the common vortex beams in the ...

Claims

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Application Information

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IPC IPC(8): G01J1/42G01J1/04
CPCG01J1/4257G01J1/0418G01J1/0411
Inventor 刘欣陈倩马普娟梁春豪蔡阳健
Owner SHANDONG NORMAL UNIV
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