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Electric field detection device based on double-layer precious metal micro-nano structure

A technology of micro-nano structure and detection device, applied in the field of electric field detection, can solve the problems of low sensitivity and the like

Inactive Publication Date: 2021-02-26
彭彦莉
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The sensitivity of traditional electric field measurement devices is low, and it is of great significance to explore electric field detection technology based on new principles to improve the sensitivity of electric field measurement

Method used

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  • Electric field detection device based on double-layer precious metal micro-nano structure
  • Electric field detection device based on double-layer precious metal micro-nano structure
  • Electric field detection device based on double-layer precious metal micro-nano structure

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Embodiment 1

[0022] The invention provides an electric field detection device based on a double-layer precious metal micro-nano structure, such as figure 1 As shown, it includes a base layer 1, a heating part 2, a first noble metal micro-nano structure layer 3, an organic conjugated polymer material part 4, a second noble metal micro-nano structure layer 5, a first force applying part 6, a second force applying Part 7. The surface of the base layer 1 is provided with pits, the heating part 2 is placed in the pits, and the surface of the heating part 4 is flush with the surface of the base layer 1 . The material of the base layer 1 is a heat insulating material, which is used to insulate the heat generated by the heating part 2 . The heating part 2 can generate high temperature by connecting other high-temperature objects, or by generating heat through resistance, which is not specifically limited here. The first noble metal micro-nano structure layer 3 is fixed on the surface of the heat...

Embodiment 2

[0027] On the basis of Embodiment 1, the first nanorods 31 are along the line connecting the first force applying part 6 and the second force applying part 7 . The direction of the second nanorods 51 is perpendicular to the direction of the line connecting the first force applying part 6 and the second force applying part 7 . In this way, under the action of the first force application part 6 and the second force application part 7, the second nanorod 51 moves along its side direction, and the positional movement of the second nanorod 51 can change the chiral composite structure more significantly. Circular dichroism for higher sensitivity electric field detection.

Embodiment 3

[0029] On the basis of Embodiment 2, the ends of the second nanorods 51 are located above the ends of the first nanorods. In this way, it is easier for the first nanorod 31 and the second nanorod 51 to form a bonded resonance mode, thereby realizing a stronger circular dichroism signal, thereby realizing higher sensitivity electric field detection.

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Abstract

The invention provides an electric field detection device based on a double-layer precious metal micro-nano structure. The surface of a substrate layer is provided with a pit, a heating part is disposed in the pit, the surface of the heating part is flush with the surface of the substrate layer, and a first precious metal micro-nano structure layer is fixed on the heating part; the organic conjugated polymer material part is arranged on the first precious metal micro-nano structure layer and the substrate layer, the second precious metal micro-nano structure layer is arranged on the surface ofthe organic conjugated polymer material part at the top of the first precious metal micro-nano structure layer, and the first force application part and the second force application part are arrangedon the two sides of the heating part on the substrate layer respectively. The first force application part and the second force application part are fixedly connected to the two ends of the organic conjugated polymer material part respectively, and the first precious metal micro-nano structure layer and the second precious metal micro-nano structure layer form a chiral composite structure. The device has the advantage of high electric field detection sensitivity.

Description

technical field [0001] The invention relates to the field of electric field detection, in particular to an electric field detection device based on a double-layer precious metal micro-nano structure. Background technique [0002] The measurement of the electric field is not only of great significance to military industries such as missiles, aircrafts, and rocket launches, but also to urban environmental pollution, oil refineries, ultra-clean laboratories, oil storage stations, etc. With a wide range of applications. The sensitivity of traditional electric field measurement devices is low, and it is of great significance to explore electric field detection technology based on new principles to improve the sensitivity of electric field measurement. Contents of the invention [0003] In order to solve the above problems, the present invention provides an electric field detection device based on a double-layer noble metal micro-nano structure, including a base layer, a heatin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/00G01R29/08B81B7/04
CPCB81B7/04B81B2201/0292G01R29/00G01R29/08
Inventor 不公告发明人
Owner 彭彦莉