Interface joint debugging test method and device, electronic equipment and storage medium
A test method and technology of electronic equipment, applied in the test field, can solve problems such as low efficiency and slow response speed, and achieve the effect of improving the timeliness of solving, improving user experience, and meeting the needs of business development
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[0047] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0048] refer to figure 1 As shown, it is a schematic diagram of an optional hardware architecture of the electronic device 1 of the present invention.
[0049] The electronic device 1 includes but not limited to: a memory 11 , a processor 12 , a display 13 and a network interface 14 . The electronic device 1 is connected to the network through the network interface 14 to obtain raw data. ...
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