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Monomolecular force electric characterization system based on substrate movement and control method thereof

A molecular electromechanical and substrate technology, applied in instruments, measuring devices, scanning probe microscopy, etc., can solve the problems of simultaneous measurement of force signals and conductance signals, needle tip oscillation, etc., and achieve easy measurement, promotion of development, and universal adaptable effect

Active Publication Date: 2021-03-23
XIAMEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the needle tip is a sensitive measurement, for all probe microscopes, using piezoelectric or motor to control the needle tip movement will cause the needle tip to oscillate, so the existing measuring device cannot measure the force signal and the conductance signal at the same time

Method used

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  • Monomolecular force electric characterization system based on substrate movement and control method thereof
  • Monomolecular force electric characterization system based on substrate movement and control method thereof
  • Monomolecular force electric characterization system based on substrate movement and control method thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0056] A single-molecule electromechanical characterization system based on substrate motion, comprising an AFM scanning head 1, a substrate 2, and a driver 3 arranged in a shielding box 4, the substrate 2 is provided with a silicon wafer on its surface, and the surface layer of the silicon wafer is gold-plated, wherein the AFM scan head at least includes a probe 6 with a diamond tip, a laser transmitter (not shown), a laser receiver (not shown), etc., the probe 6 is installed on the cantilever 5, and the probe 6 can follow the swing of the cantilever 5, and the substrate 2 contains at least modulated piezoelectric ceramics, etc. When the AFM scanning head 1 is in contact with or disconnected from the sample on the substrate 2, it can be used to detect the attractive or repulsive force between atoms.

[0057] The AFM scanning head 1 is fixedly arranged, and the AFM scanning head 1 includes a probe 6, and the surface layer of the probe 6 is gold-plated;

[0058] The substrate 2...

Embodiment 2

[0063] A single-molecule electromechanical characterization system based on substrate motion, comprising an AFM scanning head 1, a substrate 2, and a driver 3 arranged in a shielding box 4, the substrate 2 is provided with a silicon wafer on its surface, and the surface layer of the silicon wafer is gold-plated, wherein the AFM scan head at least includes a probe 6 with a diamond tip, a laser transmitter (not shown), a laser receiver (not shown), etc., the probe 6 is installed on the cantilever 5, and the probe 6 can follow the swing of the cantilever 5, and the substrate 2 contains at least modulated piezoelectric ceramics, etc. When the AFM scanning head 1 is in contact with or disconnected from the sample on the substrate 2, it can be used to detect the attractive or repulsive force between atoms.

[0064] The AFM scanning head 1 is fixedly arranged, and the AFM scanning head 1 includes a probe 6, and the surface layer of the probe 6 is gold-plated;

[0065] The substrate 2...

Embodiment 3

[0070] A single-molecule electromechanical characterization system based on substrate motion, comprising an AFM scanning head 1, a substrate 2, and a driver 3 arranged in a shielding box 4, the substrate 2 is provided with a silicon wafer on its surface, and the surface layer of the silicon wafer is gold-plated, wherein the AFM scan head at least includes a probe 6 with a diamond tip, a laser transmitter (not shown), a laser receiver (not shown), etc., the probe 6 is installed on the cantilever 5, and the probe 6 can follow the swing of the cantilever 5, and the substrate 2 contains at least modulated piezoelectric ceramics, etc. When the AFM scanning head 1 is in contact with or disconnected from the sample on the substrate 2, it can be used to detect the attractive or repulsive force between atoms.

[0071] The AFM scanning head 1 is fixedly arranged, and the AFM scanning head 1 includes a probe 6, and the surface layer of the probe 6 is gold-plated;

[0072] The substrate 2...

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Abstract

The invention relates to a monomolecular force electric characterization system based on substrate movement and a control method thereof. The monomolecular force electric characterization system comprises an AFM scanning head, a substrate and a driver which are arranged in a shielding box; a silicon wafer is arranged on the surface of the substrate, the surface layer of the silicon wafer is platedwith gold, the AFM scanning head is fixedly arranged, the AFM scanning head comprises a probe, and the surface layer of the probe is plated with gold; the substrate is driven by the driver and can move back and forth towards the AFM scanning head; and a micro-current measurement loop is connected between the probe and the substrate. By controlling the movement of the substrate, gold is plated onthe probe, the measurement micro-current measurement loop is added, an electrical signal and a mechanical signal in a molecular dynamic cracking process can be synchronously captured in combination with mechanical measurement and micro-current measurement of an atomic force microscope. Compared with a traditional monomolecular measurement technology, the method has the advantages of multiple signals, easiness in measurement, good measurement repeatability, good measurement effect and the like.

Description

technical field [0001] The invention relates to the field of molecular measurement, in particular to a single-molecule electromechanical characterization system based on substrate motion and a control method thereof. Background technique [0002] At present, the main methods for single-molecule electronic characterization are mechanically controllable break junction (MCBJ) method or scanning tunneling microscope break junction (STM-BJ) and other single-molecule electrical measurement techniques. Both of them form molecular junctions by controlling microelectrodes to form nano-gap to capture molecules, and then measure the conductance signal of molecular junctions. Alternatively, the force signal can be measured synchronously through the Atomic Force Microscope Break junction (AFM-BJ) technique. [0003] Atomic-scale characterization can be achieved using probe movement techniques. However, since the needle tip is a sensitive measurement, for all probe microscopes, using pi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24
CPCG01Q60/24
Inventor 洪文晶王海川朱奕轩谭志冰师佳
Owner XIAMEN UNIV