Automatic test system and method for multi-core DSP + FPGA framework processing circuit

Abstract

The invention provides an automatic testing system and method for a multi-core DSP + FPGA framework processing circuit, and the system comprises an automatic testing unit which is used for transmitting a testing instruction for a testing project to a programmable power supply and a testing bottom plate, receiving the testing information, collected by the testing bottom plate, of a tested board card during the testing of all functions in the testing project, and carrying out the testing judgment; a programmable power supply which is used for designing a power supply control program for each test project, receiving a test instruction of the automatic test unit, and controlling the power supply of the test bottom plate to be powered on and off; a test bottom plate which is used for receiving a test instruction of the automatic test unit, inputting signal input for each function test in a test project to the tested board card according to the test instruction, and acquiring test information of the tested board card; and a multi-test-in-one test tool which is used for simulating the installation environment of the tested board card in the whole machine. According to the invention, the multi-function test problem, the test automation problem and the single-board comprehensive test problem of the multi-core DSP are solved.

Description

technical field [0001] The invention belongs to the technical field of board card testing, and in particular relates to an automatic testing system and method for a multi-core DSP+FPGA frame processing circuit, in particular to multiple functional tests of a domestic multi-core DSP+FPGA frame board card, as well as environmental adaptability, Fully automatic test system for reliability and other tests. Background technique [0002] In the face of the increasingly complex international situation, the autonomous control of electronic components of weapons and equipment, especially core components, is an urgent problem to be solved. The application time of domestic core electronic devices is relatively short. In order to complete the successful application in weapons and equipment, a large number of long-term test verifications are required. Among them, the temperature cycle screening, high and low temperature, damp heat, reliability and other tests take a long time. In the ca...

AI Technical Summary

Problems solved by technology

Combined with the current production and testing situation, to carry out the localization verification of some electronic components in the whole machine, it is necessary to conduct a comprehensive test along with the whole machine. If batch verification is required, the whole machine needs to be comprehensively tested multiple times, which not only wastes resources, but also And have tested damage to other parts in the whole machine

[0004] To sum up the above problems, for the testing and experimental verification of domestic multi-core DSP+FPGA architecture processing circuits, three types of problems need to be solved, multi-function testing problems of multi-core DSP, automation problems of test tests, and comprehensive test problems at the single board level

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