Semiconductor wafer outer wall cleaning device and method based on reciprocating telescopic movement
A technology for cleaning devices and semiconductors, which is applied in the directions of cleaning methods using liquids, cleaning methods using tools, cleaning methods and utensils, etc., and can solve the problems such as the decrease in the cleanliness of the wafer surface, the introduction of contamination on the wafer surface, and the inability to be cleaned.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0056] see Figure 1-Figure 10 As shown, one of the purposes of this embodiment is to provide a semiconductor wafer outer wall cleaning device based on reciprocating lifting and contracting, including a scouring device 100 and a cleaning device 200 installed above the scouring device 100, and the scouring device 100 includes a mounting table 110, a storage Water tank 120 and installation box 130, water storage tank 120 is fixed on one end of installation platform 110 tops, water pump 121 is installed on the top of water storage tank 120, installation box 130 is installed on the side of installation platform 110 top and is positioned at water storage tank 120, installation box 130 The inner wall of the side is connected with a connecting column 131, and a flow cavity is provided in the connecting column 131. One end of the connecting column 131 is connected with a nozzle 132, and the water storage tank 120, the water pump 121 and the connecting column 131 are connected to each o...
Embodiment 2
[0075] In order to improve the degree of cleanliness of the wafer, the following improvements are made on the basis of Embodiment 1:
[0076] see figure 2 , Figure 11 and Figure 12 As shown, one end of the connecting column 131 is connected with the inner wall of the installation box 130 through a rotating block 250, and the other end of the connecting column 131 is provided with a rotating shaft 251, and the outer wall of the rotating shaft 251 is rotatably connected with a swivel 252, and the swivel 252 is connected to the brush 226 are fixedly connected by the connecting rod 253, and the swivel 252 is driven by the movement of the brush 226, and the swivel 252 drives the connecting column 131, and the connecting column 131 is rotated by the rotating block 250, so that the nozzle 132 can be used for different parts of the wafer. rinse.
Embodiment 3
[0078] In order to fix wafers of different sizes, the following improvements are made on the basis of Embodiment 1:
[0079] see Figure 6 and Figure 13As shown: the surface of the fixed table 214 is provided with a fixed disk 260, and the bottom of the fixed disk 260 is fixedly connected with an insertion rod 261. It communicates with another part of the through hole 215, and the fixed plate 260 is plugged into the surface of the fixed table 214, so that the fixed plate 260 can fix smaller wafers, thereby improving the use scene of the device.
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


