Method and device for scanning surface topography according to shape profile
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 上海云铸三维科技有限公司
- Publication Date
- 2021-06-04
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Abstract
Description
Technical field
[0001] The present invention relates to the field of three-dimensional scanning techniques, and in particular, to a method and apparatus for a respective profile scan surface morphology. Background technique
[0002] During the three-dimensional scanning process, the scanning method and the scan path are different due to the size of the different measurement workpieces, the surface shape and the measurement demand. Traditional handheld scanners or stent scanners require manual adjustment of the location of the measured or scanner, which is often done according to the personal experience of scanner. First, scan workers' personal capabilities limit their ability to handle different types of workpieces, and the difference in experience between different people will result in differences in scanning methods, and the secondary affects scanning efficiency or even scanning precision, second, users with large scan demand A large amount of time costs produced by artificial...