Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electrical tree detection characterization method based on microstrip transmission line

A technology of microstrip transmission line and electric branch, which is applied in the direction of measuring electricity, measuring devices, measuring electric variables, etc., can solve the problems of high requirements for experimental equipment, cumbersome experimental steps, and long experimental period, and achieve firm structure, strong applicability, low cost effect

Active Publication Date: 2021-06-04
TIANJIN UNIV
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At this time it is difficult to characterize electrical dendrites using microscopic observations
However, methods such as partial discharge measurement have high requirements for experimental equipment, cumbersome experimental steps, and long experimental cycles, which are difficult to be widely applied.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electrical tree detection characterization method based on microstrip transmission line
  • Electrical tree detection characterization method based on microstrip transmission line
  • Electrical tree detection characterization method based on microstrip transmission line

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] (1) Microstrip electrode

[0026] Prepare square microstrip electrodes with FR4 single-sided copper-clad laminates. The thickness of the copper-clad laminates is 1mm. To facilitate SMA head welding, a 1*0.4mm groove is opened in the middle of the outer side of the two microstrip electrodes. The two microstrip electrodes are located on the same horizontal line, the distance between the microstrip electrodes is 2mm, the overall length is 10mm, and the width is 4mm. In this example, the size of the test fixture is larger to ensure that the tested sample is firmly combined with the test fixture.

[0027] (2) Test fixture

[0028] Weld the feeder end of the signal line of the SMA head to the microstrip electrode for connection with the vector network analyzer during testing. The schematic diagram of the obtained test fixture structure is shown in figure 1 Shown: The grid part is the microstrip electrode, the blank part is the remaining part after the copper is corroded on ...

Embodiment 2

[0035] (1) Microstrip electrode

[0036] Use FR4 single-sided copper-clad laminates to prepare nu-shaped microstrip electrodes. The thickness of the copper-clad laminates is 1mm. The left microstrip electrode is 2mm long and opens a 1*3mm rectangular area upwards, and the right microstrip electrode is 1mm long. 3mm rectangular area. In order to facilitate SMA head welding, a 1*0.4mm slot is opened in the middle of the outer side of the two microstrip electrodes. The two microstrip electrodes are located on the same horizontal line, the distance between the microstrip electrodes is 2 mm, the overall length is 10 mm, and the width is 4 mm. After investigation, it is found that when the width of the tested sample is equivalent to that of the test fixture, the microstrip electrode part does not need a larger size to ensure the stability of the test sample and the test fixture. In order to save costs and simplify the structure of the test fixture, the manufactured test fixture Sm...

Embodiment 3

[0045] (1) Microstrip electrode

[0046] Use FR4 single-sided copper-clad laminates to prepare un-shaped microstrip electrodes. The thickness of the copper-clad laminates is 1mm. The upper side of the left microstrip electrode is 2mm long and a 1*3mm rectangular area is opened downward, and the right microstrip electrode is 1mm long. 3mm rectangular area. In order to facilitate SMA head welding, a 1*0.4mm slot is opened in the middle of the outer side of the two microstrip electrodes. The two microstrip electrodes are located on the same horizontal line, the distance between the microstrip electrodes is 2mm, the overall length is 10mm, and the width is 4mm. After investigation, it is found that when the tested sample is equivalent to the width of the test fixture, the microstrip electrode part does not need a larger size. To ensure the stability of the combination of the tested sample and the test fixture, in order to save costs and simplify the structure of the test fixture,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an electric tree detection characterization method based on a microstrip transmission line. By constructing the microstrip transmission line on the basis of the microstrip transmission line theory, a tested sample containing an electric tree serves as a part of the microstrip transmission line structure, thereby realizing characterization of the electric tree in the tested sample by measuring the transmission characteristic of the microstrip transmission line. The method specifically comprises the following steps that a micro-strip electrode and a ground electrode with specific shapes and sizes are prepared to construct a test fixture, a tested sample is placed in the test fixture to jointly form a micro-strip transmission line structure for testing transmission characteristics, the tested sample being an insulating medium in the micro-strip transmission line structure; in order to effectively characterize the electrical tree in the tested sample, resonance units are constructed in the micro-strip electrode and the ground electrode. The test fixture prepared on the basis of the method is low in cost, firm in structure and capable of being repeatedly used; in addition, the characterization of the electric tree does not depend on visible light, and the method is suitable for various transparent and non-transparent polymer materials and has high applicability in the aspect of characterization of the electric tree.

Description

technical field [0001] The invention relates to the field of high voltage and insulation. Specifically, it relates to a new method for detecting and characterizing electrical dendrites based on microstrip transmission lines. Background technique [0002] With the continuous development of the power industry and high-voltage technology, and the replacement of insulating materials, a large number of high-voltage cables and insulating materials have been put into use. Problems such as performance degradation caused by insulation aging cause high-voltage cables to fail, and various safety problems occur frequently, which greatly limits the service life of cables and materials. Among them, the degradation phenomenon of polymer electrical dendrites has become a key factor leading to cable failure and reducing the service life of insulating materials. [0003] Electric dendrite refers to the dendritic discharge channel formed by partial discharge inside the polymer under certain ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/12G01R31/20
CPCG01R31/1263G01R31/20
Inventor 肖谧马浩然王旭光张炜
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com