Scintillation material transient process characterization system and method based on laser pumping detection

A scintillation material and transient process technology, which is applied in the direction of material analysis, material analysis, and material excitation analysis by optical means, can solve the problems such as the inability to meet the detection and characterization of the transient process of scintillation materials, and reach the limit of time measurement, System settings and simple calculation methods

Active Publication Date: 2021-06-22
NORTHWEST INST OF NUCLEAR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology uses an optical technique called pumps that detects when certain substances (scents) have been excited by radiation). It also measures how long they last before being observed with another type of stimulus - their movement or activity inside them. By measuring these changes over time, this technology allows us to study different aspects related to the structure-activity relationship between specific compounds and other factors like temperature.

Problems solved by technology

This patented technical problem addressed in the patents relates to finding better ways to improve the accuracy or resolution of measuring small amounts of radiation emitted from scintilators without affecting their ability to accurately identify large changes over time.

Method used

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  • Scintillation material transient process characterization system and method based on laser pumping detection
  • Scintillation material transient process characterization system and method based on laser pumping detection
  • Scintillation material transient process characterization system and method based on laser pumping detection

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Embodiment

[0048] This embodiment provides a system for characterizing the transient process of scintillation materials based on laser pump detection. The specific system architecture is as follows: figure 1 As shown, it includes a femtosecond laser 1, a first beam splitter 2, a first mirror 3, a triple frequency generator 4, a second mirror 5, a delay line 6, a third mirror 7, a chopper 8, Balance detector 9, lock-in amplifier 10, second beam splitter 11, fourth reflector 12 and fifth reflector 13;

[0049] In this embodiment, the fundamental frequency light of the femtosecond laser 1 is selected to be 800nm, and the pulse width is about 100fs, so the time resolution is less than 200fs; LYSO and PbWO are selected 4 Two scintillation crystals are used as scintillation material samples, and the selected crystals are cylindrical crystals with a diameter of 5 cm and a thickness of 1 mm. The balance detector 9 was selected as the 2007 type automatic balance detector of Newport Company; the ...

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Abstract

The invention discloses a scintillation material transient process characterization system and method based on laser pumping detection. The system comprises a femtosecond laser, a frequency tripling generator, a delay line, a chopper, a balance detector and a lock-in amplifier, the system is based on the laser pumping detection principle, fundamental frequency light and triple frequency light of a femtosecond laser are used as detection light and pumping light respectively, diagnosis and characterization of the carrier dynamic process in the ps time scale after a scintillation material is excited are achieved through light path design, and the problem of time measurement limit of a conventional photoelectric measurement method is solved.

Description

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Claims

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Application Information

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Owner NORTHWEST INST OF NUCLEAR TECH
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