ADC channel calibration method

A calibration method and channel technology, applied in the direction of analog/digital conversion calibration/testing, etc., can solve problems such as poor consistency, unstable built-in reference source, and difficulty in meeting design requirements with built-in reference source, so as to improve economic utilization Effect

Inactive Publication Date: 2021-08-27
WUHAN TURBO TECH
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Problems solved by technology

[0002] Some microcontrollers in the existing technology do not have an external analog-to-digital converter ADC (Analog-to-Digital Converter) external reference channel, so when using the ADC, the built-in reference source of the chip must be used. Due to the instability of the built-in reference source, temperature drift Larger, poor consistency and other issues
For products with high requirements for ADC acquisition, the built-in reference source is difficult to meet the design requirements
The replacement of the single-chip microcomputer platform will bring about major changes in the software architecture, and it will take longer to stabilize

Method used

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Embodiment Construction

[0018] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0019] figure 1 It is a schematic flow chart of an ADC channel calibration method provided by an embodiment of the present invention, such as figure 1 shown, including:

[0020] 101. Externally connect a reference circuit to the first ADC channel of the single-chip microcomputer;

[0021] 102. Collect a reference voltage and a reference quantization value corresponding to the reference circuit on the first ADC channel;

[0022] 103. Turn on the remaining ADC channels on the single-chip microcomputer, respectively measure the quantization values ​​corresponding to each ADC channel, so as to calculate the calibration voltage of each ADC channel.

[0023] Specifically, in...

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Abstract

The invention provides an ADC channel calibration method. The method comprises the steps: enabling a reference circuit to be externally connected to a first ADC channel of a single-chip microcomputer; acquiring a reference voltage and a reference quantized value corresponding to the reference circuit on the first ADC channel; starting the rest ADC channels on the single-chip microcomputer, and respectively measuring quantized values corresponding to the ADC channels so as to calculate and obtain calibration voltages of the ADC channels. According to the ADC channel calibration method provided by the embodiment of the invention, redundant ADC channels of the single-chip microcomputer are utilized, a reference source chip or circuit is additionally arranged, the problem that part of single-chip microcomputers are not provided with external reference sources is solved, the ADC sampling accuracy is improved, the method has little influence on the cost of the circuit, and the economic utilization rate is improved.

Description

technical field [0001] The present invention relates to the technical field of single-chip microcomputers, and more particularly, relates to an ADC channel calibration method. Background technique [0002] Some microcontrollers in the existing technology do not have an external analog-to-digital converter ADC (Analog-to-Digital Converter) external reference channel, so when using the ADC, the built-in reference source of the chip must be used. Due to the instability of the built-in reference source, temperature drift Larger, poor consistency and other issues. For products with high requirements for ADC acquisition, the built-in reference source is difficult to meet the design requirements. The replacement of the single-chip microcomputer platform will bring about major changes in the software architecture, and it will take longer to stabilize. [0003] Therefore, there is an urgent need for a new ADC channel calibration method to solve the above problems. Contents of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/10
Inventor 刘振吴华意王西刚刘睿恒
Owner WUHAN TURBO TECH
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