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High-resolution photothermal pulse compression thermal imaging detection method based on nonlinear frequency modulation

A non-linear frequency modulation and pulse compression technology, applied in the direction of material defect testing, etc., can solve the problems of limited detection depth range and unfavorable high-resolution pulse compression thermal imaging, and achieve high signal-to-noise ratio, easy to implement, and simple method Effect

Active Publication Date: 2022-03-29
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the chirp excitation waveform, its matched filter output usually has high sidelobes, which is not conducive to high-resolution pulse compression thermal imaging
For phase-modulated Barker code excitation waveform, the waveform has good anti-noise performance by modulating the phase of the excitation waveform, but its detection depth range is usually limited

Method used

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  • High-resolution photothermal pulse compression thermal imaging detection method based on nonlinear frequency modulation
  • High-resolution photothermal pulse compression thermal imaging detection method based on nonlinear frequency modulation
  • High-resolution photothermal pulse compression thermal imaging detection method based on nonlinear frequency modulation

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Experimental program
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Effect test

Embodiment 1

[0048] Step 1) Use the nonlinear frequency modulation signal whose instantaneous frequency curve shown in formula (1) is a concave quadratic function as the excitation signal, and transmit the excitation signal to heat the sample to be tested, wherein the initial frequency f of the excitation signal is 1 =0.1×(1-0.6)Hz,, stop frequency f 2 =0.1×(1+0.6)Hz, excitation duration T c =130s; the waveform of the excitation signal is as figure 2 (a) as shown by the solid line;

[0049] Step 2) Use the infrared thermal imager to obtain the thermal wave echo signal on the surface of the sample to be tested. The waveform of the thermal wave echo signal is as follows: figure 2 (a) as shown by the dotted line;

[0050] Step 3) Use formula (3) to process the excitation signal and the thermal wave echo signal through matched filtering to obtain the output signal of the matched filtering, as shown in figure 2 (b) shown.

Embodiment 2

[0052] Step 1) Use the nonlinear frequency modulation signal whose instantaneous frequency curve shown in formula (1) is a concave quadratic function as the excitation signal, and transmit the excitation signal to heat the sample to be tested, wherein the initial frequency f of the excitation signal is 1 =0.1×(1-0.6)Hz,, stop frequency f 2 =0.1×(1+0.6)Hz, excitation duration T c =130s; the waveform of the excitation signal is as image 3 (a) as shown by the solid line;

[0053] Step 2) Use the infrared thermal imager to obtain the thermal wave echo signal on the surface of the sample to be tested. The waveform of the thermal wave echo signal is as follows: image 3 (a) as shown by the dotted line;

[0054] Step 3) Using formula (3) to perform matching filter processing on the excitation signal and the thermal wave echo signal to obtain a matched filter output signal;

[0055] Step 4) Process the output signal of the matched filter plus a Gaussian window function to obtain ...

Embodiment 3

[0057] Step 1) Use the nonlinear frequency modulation signal whose instantaneous frequency curve shown in formula (1) is a concave quadratic function as the excitation signal, and transmit the excitation signal to heat the sample to be tested, wherein the initial frequency f of the excitation signal is 1 =0.1×(1-0.6)Hz, stop frequency f 2 =0.1×(1+0.6)Hz, excitation duration T c =130s; the waveform of the excitation signal is as Figure 4 (a) as shown by the solid line;

[0058] Step 2) Use the infrared thermal imager to obtain the thermal wave echo signal on the surface of the sample to be tested. The waveform of the thermal wave echo signal is as follows: Figure 4 (a) as shown by the dotted line;

[0059] Step 3) Using formula (3) to perform matching filter processing on the excitation signal and the thermal wave echo signal to obtain a matched filter output signal;

[0060] Step 4) Process the matched filter output signal with a Kaiser window function to obtain the phot...

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Abstract

The present invention provides a high-resolution photothermal pulse compression thermal imaging detection method based on nonlinear frequency modulation, which includes the following steps: step 10) using a nonlinear frequency modulation signal whose instantaneous frequency curve is a concave quadratic function as an excitation signal, and transmitting the The excitation signal is used to heat the sample to be tested; step 20) using an infrared thermal imager to obtain a thermal wave echo signal on the surface of the sample to be tested; step 30) performing matched filtering processing on the excitation signal and the thermal wave echo signal, Get the matched filter output signal. The matched filter output signal obtained by the method of the invention has very low side lobe and very narrow main peak, so that the obtained photothermal pulse compression thermal imaging signal of the sample to be tested has high signal-to-noise ratio and depth resolution.

Description

technical field [0001] The invention belongs to the technical field of multi-physical field non-destructive testing, and in particular relates to a high-resolution photothermal pulse compression thermal imaging detection method based on nonlinear frequency modulation. Background technique [0002] In recent years, pulse compression thermal imaging technology has been applied to the non-destructive testing of industrial composite materials, biological tissues and artworks. It usually matches the obtained thermal wave signal with the transmitted encoded excitation waveform to obtain the Matched filtering output of physical information inside the sample; this technology can significantly improve the signal-to-noise ratio and increase the detection range / depth resolution of thermal imaging even when only using a low-power external excitation source, so it is usually not used for the test Thermal damage occurs on the sample surface. Since the selection of excitation waveform in ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/72
CPCG01N25/72
Inventor 张辉罗志涛殷国栋王胜
Owner SOUTHEAST UNIV