Silicon-based multi-mode interference modulation Fourier transform spectral measurement method and system
A Fourier transform and mode interference technology, which is applied in the field of silicon-based multi-mode interferometric modulation Fourier transform spectroscopy, which can solve the problems of unfavorable system stability, time resolution, and limited application scenarios.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0027] The technical solution of the present invention will be further described in conjunction with the accompanying drawings and embodiments.
[0028] Since the optical path difference OPD is equal to the effective refractive index n eff The product of the arm length difference ΔL, the number of effective OPD sampling points N that can be provided by each MZI OPD,Single Equal to the number N of waveguide modes that each MZI can carry and interfere with mode . According to the Rayleigh criterion, the spectral bandwidth measured by Fourier transform spectroscopy is proportional to the sampling rate of the interference modulation signal. The smaller the sampling OPD interval is, the higher the sampling rate of the interference modulation signal is, the larger the spectral bandwidth is; The resolution is proportional to the maximum sampling OPD of the interferometric modulation signal, the larger the maximum sampling OPD, the higher the spectral resolution. When the size of t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com