Integrated multi-probe layered scanning high-precision measuring probe structure
A layered scanning and multi-probe technology, which is applied in the direction of measuring devices, analyzing materials, and material analysis through electromagnetic means, can solve the problem of uneven outer diameter of measuring probes, deformation of outer plastic casings, unstable dielectric constants, etc. problems, to achieve the effect of excellent mechanical strength, extended service life, excellent mechanical properties and electrical properties
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0023] Embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings.
[0024] Such as figure 1 As shown, the integrated multi-probe layered scanning high-precision measuring probe structure includes the measuring probe 2 extending into the measuring pipe 1, the measuring probe 2 and the measuring pipe 1 are concentrically arranged, and the joints are equipped with sealing rings 3 For sealing, the sealing ring 3 is specifically a fluorine rubber Y-ring. The measuring probe 2 is composed of a ceramic rod 21, a double-sided flexible copper-clad laminate 22, and a plastic insulating sleeve 23. The ceramic rod 21 is connected to the double-sided flexible copper-clad laminate 22, and the double-sided flexible copper-clad A plastic insulating sleeve 23, the plastic insulating sleeve 23 can isolate the measured liquid from the double-sided flexible copper clad laminate 22. Specifically, ceramics have the characteristics...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com