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A non-destructive testing terahertz linear array radar scanning imaging system and method

A terahertz linear array and radar scanning technology, applied in the field of terahertz imaging, can solve the problems of difficult to accurately detect defects, low resolution, etc., to overcome the limitation of link cavity space, improve imaging resolution and imaging speed boosted effect

Active Publication Date: 2022-07-29
GUANGDONG UNIV OF TECH
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Problems solved by technology

[0004] This application provides a terahertz linear array radar scanning imaging system and method for non-destructive testing, which is used to solve the problem that the imaging system in the prior art has a low resolution for imaging non-dielectric composite materials, making it difficult to accurately detect defects. technical problem

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  • A non-destructive testing terahertz linear array radar scanning imaging system and method
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  • A non-destructive testing terahertz linear array radar scanning imaging system and method

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[0059] In order to make those skilled in the art better understand the solutions of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only It is a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0060] Because in the prior art, when detecting defects of non-dielectric composite materials, high-frequency millimeter-wave / terahertz sources are usually used for defect imaging detection, but the energy of high-frequency millimeter-wave / terahertz sources is low, And the penetration is poor, which makes the imaging r...

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Abstract

The present application discloses a non-destructive detection terahertz linear array radar scanning imaging system and method, which adopts a one-dimensional sparse linear array with multiple transmissions and multiple receptions, combines a waveguide antenna with a one-dimensional sparse linear array, and reduces the one-dimensional sparseness through the waveguide antenna. The array element spacing in the linear array makes the equivalent linear array arrangement of the one-dimensional sparse linear array more compact, thereby improving the lateral imaging resolution. At the same time, the two-dimensional moving frame drives the waveguide antenna for scanning, and the three-dimensional topography image of the non-dielectric composite material to be detected can be obtained. At the same time, the first target image is reconstructed by the preset super-resolution image reconstruction model. Therefore, it is possible to obtain high-precision lateral resolution images in lower frequency bands, which can only be obtained in high frequency bands, reduce hardware costs, and solve the resolution of imaging systems in the prior art for non-dielectric composite materials. low, so it is difficult to accurately detect the technical problem of defects.

Description

technical field [0001] The present application relates to the technical field of terahertz imaging, and in particular, to a terahertz linear array radar scanning imaging system and method for non-destructive testing. Background technique [0002] Non-dielectric composite materials such as FRP, thermal insulation tiles, ceramics, resins, plastics, etc., usually have the following defects inside them: defects such as bubbles, delamination, fractures, etc., depending on the size of the defect, from several centimeters to several millimeters in size. [0003] In the prior art, when detecting defects in non-dielectric composite materials, high-frequency millimeter-wave / terahertz sources are usually used for defect imaging detection. However, the high-frequency millimeter-wave / terahertz sources have low energy, and Poor penetration, which makes imaging non-dielectric composites low resolution and difficult to accurately detect defects. SUMMARY OF THE INVENTION [0004] The pres...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/82G01S13/88G01S13/89G01S7/41
CPCG01N27/82G01S13/88G01S13/89G01S7/417
Inventor 程良伦徐利民王涛吴衡
Owner GUANGDONG UNIV OF TECH
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