A non-destructive testing terahertz linear array radar scanning imaging system and method

Abstract

The present application discloses a non-destructive detection terahertz linear array radar scanning imaging system and method, which adopts a one-dimensional sparse linear array with multiple transmissions and multiple receptions, combines a waveguide antenna with a one-dimensional sparse linear array, and reduces the one-dimensional sparseness through the waveguide antenna. The array element spacing in the linear array makes the equivalent linear array arrangement of the one-dimensional sparse linear array more compact, thereby improving the lateral imaging resolution. At the same time, the two-dimensional moving frame drives the waveguide antenna for scanning, and the three-dimensional topography image of the non-dielectric composite material to be detected can be obtained. At the same time, the first target image is reconstructed by the preset super-resolution image reconstruction model. Therefore, it is possible to obtain high-precision lateral resolution images in lower frequency bands, which can only be obtained in high frequency bands, reduce hardware costs, and solve the resolution of imaging systems in the prior art for non-dielectric composite materials. low, so it is difficult to accurately detect the technical problem of defects.

Description

technical field [0001] The present application relates to the technical field of terahertz imaging, and in particular, to a terahertz linear array radar scanning imaging system and method for non-destructive testing. Background technique [0002] Non-dielectric composite materials such as FRP, thermal insulation tiles, ceramics, resins, plastics, etc., usually have the following defects inside them: defects such as bubbles, delamination, fractures, etc., depending on the size of the defect, from several centimeters to several millimeters in size. [0003] In the prior art, when detecting defects in non-dielectric composite materials, high-frequency millimeter-wave / terahertz sources are usually used for defect imaging detection. However, the high-frequency millimeter-wave / terahertz sources have low energy, and Poor penetration, which makes imaging non-dielectric composites low resolution and difficult to accurately detect defects. SUMMARY OF THE INVENTION [0004] The pres...

AI Technical Summary

Problems solved by technology

[0004] This application provides a terahertz linear array radar scanning imaging system and method for non-destructive testing, which is used to solve the problem that the imaging system in the prior art has a low resolution for imaging non-dielectric composite materials, making it difficult to accurately detect defects. technical problem

Images