Grain impurity content detection method

A technology of impurity content and detection method, applied in the field of detection, can solve the problems of large amount of radiation, high cost, inability to restore interlayer information, etc., and achieve the effect of rapid calculation

Pending Publication Date: 2021-09-28
HENAN UNIVERSITY OF TECHNOLOGY
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Problems solved by technology

The traditional CT tomography technology is to image the object layer by layer. After reconstruction, the information between the layers will not be restored, and the cost is high and the radiation dose is large.

Method used

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  • Grain impurity content detection method
  • Grain impurity content detection method
  • Grain impurity content detection method

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Experimental program
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Embodiment 1

[0024] A detection method of grain impurity content:

[0025] The experimental flow chart of embodiment 1 is as figure 1 shown.

[0026] Source of materials: The materials required for the experiment come from the Xinglong National Grain Reserve in Zhengzhou City, Henan Province.

[0027] (1) The grain sample is composed of wheat and organic impurities, and the organic impurities are wheat husk and wheat straw. There are 3 test samples, all of which have a total weight of 50g, and the impurity contents of organic impurities are 2wt%, 1wt%, and 0wt%, respectively. Place the grain samples in transparent acrylic containers with a height of 6 cm, a bottom diameter of 6 cm, and a container wall thickness of 3 mm, such as figure 2 shown. During the X-ray rotary scanning process, the shape of the sample to be tested is required not to change. If a certain part of the sample is shifted during the detection process, the detection will fail. Therefore, when preparing the sample, t...

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Abstract

The invention discloses a grain impurity content detection method, which comprises the following steps of: acquiring two-dimensional slice images of a sample at different scanning angles by adopting cone beam CT (Computed Tomography), deducing the relationship between grain grain and impurity density and an X-ray absorption coefficient, and reconstructing a doped grain three-dimensional CT image according to the relationship; on the basis, establishing a region growth model based on a gray value to realize contour extraction and volume calculation of the grain seeds; and finally, introducing the stacking density of the impurities to realize rapid calculation of the grain impurity content. According to the method, the content of the impurities in the grains is detected by utilizing the cone beam CT technology for the first time, the sample is not damaged, the primitiveness of the sample is reserved, the volume of the impurities is calculated by utilizing a voxel point statistical method, and the proportion of the impurities is measured through the mass occupancy of the impurities, so that the content of the impurities in the grains is rapidly calculated.

Description

technical field [0001] The invention belongs to the technical field of detection, and relates to a detection method for grain impurity content. Background technique [0002] Impurity content is an important index in grain quality standards, and grain impurity content is also an important index for grain storage. If the proportion of impurities is too large, it will not only directly affect the food quality level, but also have a great negative impact on the storage of grain. Grain impurities can generally be divided into organic impurities and inorganic impurities: inorganic impurities are mainly soil clods, small stones, sand, broken glass and other minerals mixed in the process of grain harvesting, processing and storage; organic impurities are generally the stems and leaves of the grain itself. Shells and heterogeneous grains; the stems and leaves of plants are different from heterogeneous grains. Unlike heterogeneous grains, these impurities belong to living organisms a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/046
CPCG01N23/046
Inventor 王钢洋朱春华汪玉军徐鹏飞李智杨卫东苗田田刘浩许德刚张闻强魏蔚张雪萍
Owner HENAN UNIVERSITY OF TECHNOLOGY
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