Intelligent defect detecting and marking system for photovoltaic module

Abstract

The invention discloses an intelligent defect detecting and marking system for a photovoltaic module, and the system comprises a camera shooting device, a photographing device, a mobile camera shooting device, a first storage module, a second storage module, a mobile camera shooting acquisition device, a mobile camera shooting storage module, a control module, a display module and a control adjusting module; and the mobile camera device is connected with the mobile camera analysis module through the mobile camera acquisition module. According to the device, the camera device is arranged, the camera device and the mobile camera device are used for carrying out field detection on the photovoltaic module, and the detection accuracy and the detection efficiency of the photovoltaic module are improved through multiple detection modes; through intelligent analysis, storage and display, the working efficiency is improved for workers, the later maintenance or summarization of the damage rate and the easy damage problem of the photovoltaic module is facilitated, the improvement during later production is facilitated, the structure operation is simple, the use is convenient, and the detection result is high in credibility and high in accuracy.

Description

technical field [0001] The invention relates to a defect intelligent detection and marking system of a photovoltaic module. Background technique [0002] During the entire life cycle of photovoltaic modules in production, transportation, installation and operation, due to: [0003] (1) Material defects and improper workmanship; (2) External forces in transportation, installation and other links; (3) Due to aging during the long-term power generation process, hidden cracks, debris, virtual welds, broken grids and electrical faults will occur in the components. Hidden defects such as loss of matching, these defects were first detected using short-wave infrared technology, and are generally referred to as infrared defects in the industry. The existence of these defects can lead to the following problems: [0004] (1) During the production process of components, it will lead to a serious drop in component power and reduce the product qualification rate; [0005] (2) In the ph...

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Problems solved by technology

[0004] (1) During the production process of components, it will lead to a serious drop in component power and reduce the product qualification rate;

[0005] (2) In the photovoltaic array on the power station site, defective components are prone to hot spot phenomenon, increasing fire hazards;

[0006] (3) Defects in a small number of components will cause a barrel effect, resulting in a significant drop in the power generation of the entire photovoltaic array;

[0007] (4) Defects will intensify in nature, reducing the reliability and service life of components

[0009] The typical method CN201110313678.1 (defect detection method for silicon wafers and silicon solar cells) uses laser as the excitation source, which is not suitable for on-site testing; the typical device CN201520326478.3 (wireless remote control type autofocus photovoltaic module infrared defect detection device) adopts wireless control And the way of data acquisition can realize on-site testing, but each measurement of one piece requires a long static exposure of 5-10s, and the testing efficiency is very low

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