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Bayes analysis-based reliability enhancement test quantitative evaluation method

A quantitative evaluation and reliability technology, applied in the field of test statistics to save manpower and material resources

Active Publication Date: 2022-03-11
CHINA ELECTRONICS TECH GRP CORP NO 14 RES INST
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Problems solved by technology

Due to the limitations of time, cost, and test site conditions, the above method often adopts the delayed correction fault handling method, that is, the parent body does not change, and the AMSAA growth model is not applicable at this time

Method used

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  • Bayes analysis-based reliability enhancement test quantitative evaluation method
  • Bayes analysis-based reliability enhancement test quantitative evaluation method
  • Bayes analysis-based reliability enhancement test quantitative evaluation method

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Embodiment Construction

[0038] The technical solution of the present invention will be specifically described below in conjunction with the accompanying drawings.

[0039] The evaluation process is as follows figure 1 As shown, first judge whether there is failure data, and then judge whether it is step stress or constant stress, and then apply different models, set confidence intervals, and evaluate the comprehensive MTBF value.

[0040] Low temperature step stress test such as figure 2 As shown, starting from 0°C, every drop of 5°C is a step, and it ends at -45°C, where 0°C is kept for 5 hours, and then the temperature is kept for 2 hours at each stage, and the temperature change rate in the middle of adjacent temperature steps is 10°C / min , the fault occurred once at -45°C, and it still existed at -40°C.

[0041] High temperature step stress test such as image 3 As shown, starting from 60°C, every drop of 5°C is a step, and it ends at 70°C, where 60°C is kept for 5 hours, and then the tempera...

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Abstract

The invention discloses a reliability enhancement test quantitative evaluation method based on Bayes analysis, and the method comprises the steps: carrying out enhancement tests under different conditions, respectively employing different estimation methods, setting a certain confidence level, and carrying out staged evaluation, and obtaining a comprehensive MTBF value of the reliability enhancement test. The method overcomes the defect that the required sample size is large or the fault must be corrected in time based on a classical method, solves the problem of small subsample reliability enhancement test evaluation, especially the reliability evaluation of equipment or complete machine level, can be popularized to the field of small subsample reliability evaluation, saves manpower and material resources, accurately obtains the reliability realization level of a product, and has a wide application prospect. And resource allocation decision-making in product development is facilitated.

Description

technical field [0001] The invention belongs to the technical field of test statistics, and in particular relates to a reliability evaluation technology. Background technique [0002] With the continuous development of science and technology, the materials, processes, and technologies of products are constantly iteratively updated, and people's demand for high-reliability products is increasing. [0003] Different from the traditional reliability growth test, the reliability enhancement test is a provocative test. High stress levels are used as test conditions to fully stimulate potential defects and weak links in product design, and corresponding improvement measures are taken to accelerate product reliability growth in a short period of time, greatly improve test efficiency, and reduce costs. [0004] In the process of intensive testing, taking improvement measures to the product will change the status of the product. The parameters in the acceleration model will also ch...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F119/02
CPCG06F30/20G06F2119/02
Inventor 王宏孙强王宇歆
Owner CHINA ELECTRONICS TECH GRP CORP NO 14 RES INST
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