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Method for predicting service life of direct-current self-healing metallized film capacitor

A metallized film, life prediction technology, applied in capacitance measurement, instrument, measurement of electricity and other directions, can solve the problems of capacitor capacity decline, end of capacitor life, limited life evaluation methods, etc., to achieve the effect of simple operation and high prediction accuracy

Pending Publication Date: 2022-04-29
XI AN JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In actual operation, the self-healing process of the metallized film continues to occur, so that the loss of the metal electrode leads to a decrease in the capacity of the capacitor, and then the life of the capacitor ends, which ultimately affects the safe and reliable operation of the engineering system where the capacitor is located.
However, the existing life evaluation methods for self-healing metallized film capacitors are limited, so it is of practical significance to explore the prediction method of the end of life of metallized film capacitors

Method used

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  • Method for predicting service life of direct-current self-healing metallized film capacitor
  • Method for predicting service life of direct-current self-healing metallized film capacitor
  • Method for predicting service life of direct-current self-healing metallized film capacitor

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Embodiment Construction

[0022] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are part of the implementation of the present invention. way, but not all implementations. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0023] Therefore, the following pair of Figure 1 to Figure 4 The detailed descriptions of the embodiments of the invention provided in the section are not intended to limit the scope of the claimed invention but represent only selected embodiments of the invention. Based on the implementation manners in the present invention, a...

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Abstract

The invention discloses a method for predicting the service life of a direct-current self-healing metallized film capacitor, and the method comprises the steps: measuring the capacitance C0 and the test voltage Ui of the direct-current self-healing metallized film capacitor before a test, and carrying out an aging test; measuring the capacitance of the direct-current self-healing metallized film capacitor at preset intervals to record capacitance values Cx at different moments and a capacitance difference delta C between adjacent measurements; disassembling the direct-current self-healing metallized film capacitor to obtain a film capacitor core; disassembling the film capacitor core layer by layer to obtain an aged internal film sample; counting the lost areas of the metal electrode in the multiple sections of samples to obtain area loss data at different positions, and analyzing the area loss data through logarithmic normal distribution to obtain a fitting result so as to calculate the average lost metal electrode area Sn of each breakdown point; and drawing images on Weibull coordinate paper according to the failure probability phi and the service life t to obtain a model that the service life of the capacitor is influenced by the self-healing characteristic of the local metallized film.

Description

technical field [0001] The invention belongs to the aging technical field of DC self-healing metallized film capacitors, and in particular relates to a life prediction method for DC self-healing metallized film capacitors. Background technique [0002] Metallized film capacitors have self-healing properties because their nanometer-thick metal electrodes can recover their insulating properties after evaporation loss under the action of high-current heat formed during the electroweak point breakdown process in the medium. This feature endows metallized film capacitors with high reliability and large capacity, and is widely used in engineering fields such as UHV AC and DC transmission systems and flexible DC transmission systems. In actual operation, the self-healing process of the metallized film continues to occur, so that the loss of the metal electrode leads to a decrease in the capacity of the capacitor, and then the life of the capacitor ends, which ultimately affects the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R27/26G01D21/02G06F30/20G06F119/02
CPCG01R31/003G01R31/129G01R27/2605G01D21/02G06F30/20G06F2119/02
Inventor 程璐刘文凤李志元徐哲王镜然
Owner XI AN JIAOTONG UNIV