Voltage stabilizer screening method, testing device and screening system
A technology of testing device and screening method, which is applied to control/regulating systems, instruments, regulating electrical variables, etc., can solve the problems of inconvenient disassembly and assembly, device damage, batch differences of voltage stabilizers, etc., and achieves quick and easy testing. damage effect
Pending Publication Date: 2022-05-06
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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Problems solved by technology
[0003] However, in the process of production and debugging for many times, we found that the phase noise characteristics of the voltage regulator have batch differences, and because the voltage regulator is usually placed on the back of the crystal oscillator circuit board and is packaged in TO-39, it is inconvenient to disassemble and frequently disassemble. Easy to cause device damage
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[0032] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.
[0033] Such as figure 1 As shown, this embodiment discloses a voltage regulator screening method. In this embodiment, the voltage regulator screening method includes:
[0034] S20: Connect the three-terminal voltage regulator to be tested and the crystal oscillator to the test device by plugging in, and the output end of the test device is connected to the phase noise tester through an SMA adapter;
[0035] S40: Determine whether the test result of the phase noise tester satisfies the phase noise index of the crystal osc...
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The invention discloses a voltage stabilizer screening method, a testing device and a screening system.The voltage stabilizer screening method comprises the steps that a three-terminal voltage stabilizer to be tested and a crystal oscillator are connected with the testing device in a plugging mode, and the output end of the testing device is connected with a phase noise tester through an SMA adapter; and judging whether the test result of the phase noise tester meets the phase noise index of the crystal oscillator, and if so, determining that the three-terminal voltage regulator to be tested is qualified. The testing device is connected with the three-terminal voltage stabilizer, the crystal oscillator and the phase noise tester in sequence, phase noise screening testing is carried out on the crystal oscillator through the three-terminal voltage stabilizer before installation, testing is fast, devices are not damaged, and the problem that the voltage stabilizer is damaged due to frequent disassembly and assembly is solved.
Description
technical field [0001] The invention relates to the technical field of linear power supplies. More specifically, it relates to a voltage stabilizer screening method, testing device and screening system. Background technique [0002] Because of its good frequency characteristics, crystal oscillators are often used as time-frequency references and are widely used in communication, radar, navigation and guidance systems. When the crystal oscillator power supply voltage changes, it will cause the crystal oscillator operating point to drift, the input impedance will change, and the heating power tube heating current will swing, which will cause the oscillation frequency to change. Therefore, constant temperature crystal oscillators usually need to be designed for voltage stabilization. [0003] However, in the process of production and debugging for many times, we found that the phase noise characteristics of the voltage regulator have batch differences, and because the voltage ...
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CPCG05F1/625
Inventor 罗梦佳彭慧丽于德江乔志峰韩艳菊苏霞于姗姗王巨陈金和
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT