Wireless transceiver chip sensitivity testing method, device and electronic equipment
A wireless transceiver chip, sensitivity testing technology, applied in electrical components, receiver monitoring, transmitter monitoring, etc., can solve the problems of high test cost, inability to test sensitivity of multiple wireless transceiver chips, long test time, etc., to achieve test cost High, solve the effect of test sensitivity and long test time
Active Publication Date: 2022-07-12
HOPE MICROELECTRONICS CO LTD +1
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[0003] The embodiment of the present invention provides a wireless transceiver chip sensitivity test method, device, and electronic equipment to at least solve the technical problems that the sensitivity of multiple wireless transceiver chips cannot be tested in parallel at the same time, and the test time is long and the test cost is high.
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[0023] In order to make those skilled in the art better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only Embodiments are part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0024] It should be noted that the terms "first", "second" and the like in the description and claims of the present invention and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used may be interchanged under appropriate ...
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The invention discloses a sensitivity testing method, device and electronic equipment of a wireless transceiver chip. The method includes: outputting a test modulated radio frequency signal from a radio frequency vector signal source; sending the test modulated radio frequency signal to a target power divider, and the target power divider divides the test modulated radio frequency signal into multiple test radio frequency signals; Each test RF signal is connected to an interface on the parallel test pin card of the wireless transceiver chip, wherein each interface is connected to a wireless transceiver chip to be tested; the output signal of the wireless transceiver chip includes a square wave signal of a specific frequency. In this case, it is determined that the wireless transceiver chip passes the sensitivity test; in the case that the output signal of the wireless transceiver chip does not contain a square wave signal of a specific frequency, it is determined that the wireless transceiver chip fails the sensitivity test. The invention solves the technical problems that the sensitivity cannot be tested in parallel with multiple wireless transceiver chips at the same time, the test time is long, and the test cost is high.
Description
technical field [0001] The present invention relates to the field of semiconductors, and in particular, to a method, device and electronic equipment for testing the sensitivity of a wireless transceiver chip. Background technique [0002] In the prior art, the receiving performance of the wireless transceiver chip is getting better and better, such as the working frequency of 840MHz, the communication rate of 20kbps, the FSK (Frequency-shift keying frequency shift modulation) signal with a frequency offset of 20KHz, the sensitivity can be achieved -111dBm, such a small signal cannot be tested during the production process. There are the following problems: the test time is long, the test equipment is very expensive, resulting in very high production costs; the consistency is not good, and it is impossible to test the chip with low sensitivity. ; For the wireless transceiver chip, there is no way to measure the sensitivity performance in the wafer test, but only the function ...
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IPC IPC(8): H04B17/10H04B17/15H04B17/20H04B17/29
CPCH04B17/101H04B17/15H04B17/20H04B17/29
Inventor 阳雄凡
Owner HOPE MICROELECTRONICS CO LTD