FPGA-based analog-to-digital converter test system and method

Abstract

The invention provides an analog-to-digital converter test system and method based on an FPGA, and the system comprises an upper computer, an FPGA control board card, a high-precision digital-to-analog converter source board card, and an analog-to-digital converter test board card. An FPGA control board card, a high-precision digital-to-analog converter source board card and an analog-to-digital converter test board card involved in test acquisition are all board card structures based on circuit boards, plug-and-play is supported, large-size test equipment is not needed, the size of a test system is reduced, special high-precision instrument equipment is not needed, and the cost of the test system is reduced; continuous sampling analog signals are generated based on the high-precision digital-to-analog converter, the sampling data size is small, the data size processed by the upper computer is reduced, the data calculation amount of the upper computer is further reduced by combining data splitting and merging operation, linear fitting and subtraction calculation, the test time is shortened, and the test efficiency is improved. And the test efficiency is effectively improved while the linearity index of the analog-to-digital converter to be tested is accurately measured.

Description

technical field [0001] The invention relates to the technical field of circuit testing, in particular to an FPGA-based analog-to-digital converter testing system and method. Background technique [0002] As an important branch of the current integrated circuit testing field, the testing of analog-to-digital converters has reached a new height with the rapid development of integrated circuits. The resolution of domestic SAR structure analog-to-digital converters can reach 20 bits, and the resolution of sigma-delta structure analog-to-digital converters can reach 32 bits. Using traditional methods to test such ultra-high-precision analog-to-digital converters not only requires connecting high-precision signal source instruments and precision test instruments, but also requires a large amount of data to be sampled, which makes the test cost expensive and low test efficiency. [0003] The traditional analog-to-digital converter separation instrument test platform has two struct...

AI Technical Summary

Problems solved by technology

Using the traditional method to realize the test of such an ultra-high-precision analog-to-digital converter not only needs to connect high-precision signal source instruments and precision test instruments, but also requires a large amount of sampled data, which makes the test cost expensive and the test efficiency low

[0003] The traditional analog-to-digital converter separation instrument test platform has two structures: high-precision signal source instrument + analog-to-digital converter to be tested or analog-to-digital converter to be tested + precision test instrument, high-precision signal source instrument + analog-to-digital conversion to be tested The structure of the device is to use a high-precision signal source instrument to output continuous analog signals, and the data converted by the analog-to-digital converter is sent back to the host computer for direct calculation, which can achieve the most realistic linearity index and signal-to-noise ratio of the analog-to-digital converter And other indicators, however, while reaching the linearity indicator, a considerable amount of data is required to support it, which greatly increases the test time. In batch testing, such testing efficiency is extremely low, and high-precision signal source instruments are also relatively expensive; The structure of the analog-to-digital converter to be tested + the precision test instrument is to use the general signal source to output the sampled analog signal, and use the precision test instrument to correct the signal source, which can achieve the linearity index while reducing the amount of sampled data, but , the cost of precision test instruments is expensive, and the realization of dynamic performance indicators is still inseparable from high-precision signal source instruments. The repeated communication of the calibration algorithm greatly increases the test time and reduces the test efficiency.

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