Automatic testing device for laser chip
An automatic test and laser technology, which is applied in the direction of measuring devices, measuring device casings, electronic circuit tests, etc., can solve problems such as inconsistency and unstable test data, eliminate fatigue problems, eliminate small rotation offsets, and ensure accuracy Effect
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Embodiment 1
[0024] Embodiment 1: An automated testing device for a laser chip, comprising: a substrate 21, a test table 22 mounted on the upper surface of the substrate 21, a drive bracket 23 mounted on the outside of the substrate 21, and a drive bracket 23 mounted on the test table 22. The upper test probe assembly 24, the test probe assembly 24 includes: a main body 1 connected to the drive bracket 23, a support plate 2, a probe 51 for contacting the chip to be tested, and a moving point contact probe 31, the One end of the support plate 2 is installed with a cantilever 4, the other end is installed with the moving point contact probe 31, and one side of the lower end face of the main body 1 is provided with a static point contact probe 32 located on the upper part of the moving point contact probe 31 and corresponding to it. When the needle is in contact with the chip to be tested, the moving point contact probe rotates with the support plate away from the static point contact probe, t...
Embodiment 2
[0031] Embodiment 2: An automated testing device for a laser chip, comprising: a substrate 21, a test table 22 mounted on the upper surface of the substrate 21, a drive bracket 23 mounted on the outside of the substrate 21, and a drive bracket 23 mounted on the test table 22. The upper test probe assembly 24, the test probe assembly 24 includes: a main body 1 connected to the drive bracket 23, a support plate 2, a probe 51 for contacting the chip to be tested, and a moving point contact probe 31, the One end of the support plate 2 is installed with a cantilever 4, the other end is installed with the moving point contact probe 31, and one side of the lower end face of the main body 1 is provided with a static point contact probe 32 located on the upper part of the moving point contact probe 31 and corresponding to it. One end of the cantilever 4 away from the support plate 2 is fixed with a probe seat 5 on which the probe 51 is installed;
[0032] An adapter seat 6 is installed...
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