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Semiconductor structure and manufacturing method thereof

A semiconductor and main body technology, applied in semiconductor/solid-state device manufacturing, transistors, electrical components, etc.

Pending Publication Date: 2022-07-15
YANGTZE MEMORY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, there are still many problems in the existing transistors that need to be improved urgently.

Method used

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  • Semiconductor structure and manufacturing method thereof
  • Semiconductor structure and manufacturing method thereof
  • Semiconductor structure and manufacturing method thereof

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Embodiment Construction

[0085] In order to make the technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be further elaborated below with reference to the accompanying drawings and embodiments. While exemplary embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present invention will be more thoroughly understood, and will fully convey the scope of the present invention to those skilled in the art.

[0086] The invention is described in more detail by way of example in the following paragraphs with reference to the accompanying drawings. The advantages and features of the present invention will become apparent from the following description and claims. It should be noted that, the accompanying drawings are...

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Abstract

The embodiment of the invention provides a semiconductor structure and a manufacturing method thereof. The semiconductor structure includes: at least one transistor, the transistor including: a channel region in a semiconductor layer; the grid electrode is at least located on one side of the channel region; the source region is located at the first end of the channel region; the drain electrode region is located at the second end of the channel region; the first end and the second end are two opposite ends of the channel region in a first direction, and the first direction is the thickness direction of the semiconductor layer; at least one of the source region and the drain region comprises a first layer region and a second layer region, and each of the source region and the drain region comprises a third layer region; the first layer region is positioned on one side close to the channel region; the third layer region is positioned on one side far away from the channel region; the second layer region is located between the first layer region and the third layer region; the doping type of the second layer region is different from those of the first layer region and the third layer region, or the second layer region is an intrinsic non-doped region. The parasitic capacitance of the transistor can be reduced, and the response speed of the transistor can be improved.

Description

technical field [0001] The present application relates to the field of semiconductor technology, and relates to, but is not limited to, a semiconductor structure and a fabrication method thereof. Background technique [0002] Transistors in semiconductor structures are widely used as switching devices or driving devices in electronic equipment. For example, transistors may be used in Dynamic Random Access Memory (DRAM) to control each memory cell. It can be understood that the basic memory cell structure of the dynamic random access memory consists of a transistor and a storage capacitor, and its main function principle is to use the amount of stored charge in the capacitor to represent whether a binary bit (bit) is 1 or 0. [0003] However, the existing transistors still have many problems that need to be improved. SUMMARY OF THE INVENTION [0004] In order to solve one or more of the related technical problems, embodiments of the present invention provide a semiconduct...

Claims

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Application Information

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IPC IPC(8): H01L27/108H01L21/8242
CPCH10B12/30H10B12/05
Inventor 孙超江宁刘威
Owner YANGTZE MEMORY TECH CO LTD
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