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CO/CU selective wet etchant

A technology of water-miscible solvents and preparations, which is applied in the field of wet etchant and can solve the problems of low cobalt etching rate and the like

Pending Publication Date: 2022-08-02
VERSUM MATERIALS US LLC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although conventional copper wet etchants provide high etch rates at high pH, ​​due to the formation of inert Co(OH) 2 layer, the cobalt etch rate is very low at high pH

Method used

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  • CO/CU selective wet etchant
  • CO/CU selective wet etchant
  • CO/CU selective wet etchant

Examples

Experimental program
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Embodiment

[0191] Reference will now be made to more specific embodiments of the present disclosure and the experimental results supporting these embodiments. The following examples are given to more fully illustrate the disclosed subject matter and should not be construed as limiting the disclosed subject matter in any way.

[0192] It will be apparent to those skilled in the art that various modifications and variations can be made in the disclosed subject matter and the specific embodiments provided herein without departing from the spirit or scope of the disclosed subject matter. Accordingly, the disclosed subject matter, including the description provided by the following examples, is intended to cover modifications and variations of the disclosed subject matter that fall within the scope of any claims and their equivalents.

[0193] Materials and methods:

[0194] Ingredients and Abbreviations

[0195] Abbreviations used in the examples are as follows:

[0196]

[0197]

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PUM

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Abstract

The disclosed and claimed subject matter relates to wet etchants that exhibit high copper and cobalt etch rates, wherein the etch rate ratio between two metals can vary. The wet etchant has a composition comprising a formulation consisting of: at least one alkanolamine having at least two carbon atoms, at least one amino substituent and at least one hydroxyl substituent, wherein the amino and hydroxyl substituents are attached to two different carbon atoms; at least one pH adjusting agent for adjusting the pH of the formulation to between about 9 and about 12; at least one chelating agent; and water.

Description

[0001] background technical field [0002] The disclosed and claimed subject matter relates to wet etchants. In particular, the disclosed and claimed subject matter relates to wet etchants that exhibit high copper and cobalt etch rates, wherein the etch rate ratio between the two metals can be varied. Background technique [0003] Co / Cu composite interconnect systems are widely used in BEOL of advanced IC devices due to their good EM and TDDB (time-dependent dielectric breakdown) reliability. For the next advanced technology devices, Cu and Co recesses become more important for fully self-aligned via designs. However, conventional high-rate copper wet etchants cannot simultaneously achieve high cobalt etch rates due to (i) differences in the chemical properties of copper and cobalt and (ii) galvanic corrosion effects between the two metals. [0004] For example, it has been described (see Journal of applied electrochemistry, 33:403-10 (2003)) that monoethanolamine-based fo...

Claims

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Application Information

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IPC IPC(8): C23F1/44C23F1/34C23F1/40H01L21/3213
CPCC23F1/40C23F1/34C23F1/44H01L21/32134C09K13/06C09K13/08
Inventor 张仲逸刘文达李翊嘉
Owner VERSUM MATERIALS US LLC
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